Handbook of Silicon Semiconductor Metrology, Diebold, Alain C.

Название: Handbook of Luminescent Semiconductor Materials
ISBN: 036744593X ISBN-13(EAN): 9780367445935
Издательство: Taylor&Francis
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Цена: 63280.00 T
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Описание: This handbook explains how photoluminescence spectroscopy is a powerful and practical analytical tool for revealing the fundamentals of light interaction and, thus, the optical properties of semiconductors. The book shows how luminescent semiconductors are used in lasers, photodiodes, infrared detectors, light-emitting diodes, solid-state lamps,

Название: Handbook of Silicon Semiconductor Metrology
ISBN: 0367397161 ISBN-13(EAN): 9780367397166
Издательство: Taylor&Francis
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Цена: 67360.00 T
Наличие на складе: Невозможна поставка.
Описание: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay, acoustic film thickness, dopant dose, junction depth, and electrical measurements; particle and defect detection; and flatness following chemical mechanical polishing. Providing examples of well-developed metrology capability, the book focuses on metrology for lithography, transistor, capacitor, and on-chip interconnect process technologies.

Автор: Nawrocki Waldemar
Название: Introduction to Quantum Metrology: The Revised Si System and Quantum Standards
ISBN: 3030196798 ISBN-13(EAN): 9783030196790
Издательство: Springer
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Цена: 158380.00 T
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Описание: This book discusses the theory of quantum effects used in metrology, and presents the author`s research findings in the field of quantum electronics.

Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3319384791 ISBN-13(EAN): 9783319384795
Издательство: Springer
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Цена: 104480.00 T
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Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.

Автор: Yadav
Название: Recent Advances in Metrology
ISBN: 9811924678 ISBN-13(EAN): 9789811924675
Издательство: Springer
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Цена: 214280.00 T
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Описание: This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.

Автор: Zhang, Song
Название: Handbook of 3D Machine Vision
ISBN: 1439872198 ISBN-13(EAN): 9781439872192
Издательство: Taylor&Francis
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Цена: 209270.00 T
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Автор: Stephan Stuerwald
Название: Digital Holographic Methods
ISBN: 3030130878 ISBN-13(EAN): 9783030130879
Издательство: Springer
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Цена: 83850.00 T
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Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser

Автор: Bo Su, Eric Solecky, Alok Vaid
Название: Introduction to Metrology Applications in IC Manufacturing
ISBN: 1628418117 ISBN-13(EAN): 9781628418118
Издательство: Mare Nostrum (Eurospan)
Цена: 55170.00 T
Наличие на складе: Невозможна поставка.
Описание: Metrology has grown significantly, especially in semiconductor manufacturing, and such growth necessitates increased expertise. Until now, this field has never had a book written from the perspective of an engineer in a modern IC manufacturing and development environment. The topics in this Tutorial Text range from metrology at its most basic level to future predictions and challenges, including measurement methods, industrial applications, fundamentals of traditional measurement system characterization and calibration, semiconductor-specific applications, optical metrology measurement techniques, charged particle measurement techniques, x-ray and in situ metrology, hybrid metrology, and mask making. The accompanying CD includes example spreadsheets of measurement uncertainty analysis—specifically, precision, matching, and relative accuracy.

Автор: Stephan Stuerwald
Название: Digital Holographic Methods
ISBN: 3030001687 ISBN-13(EAN): 9783030001681
Издательство: Springer
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Цена: 102480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser

Автор: Viacheslav Karmalita
Название: Metrology of Automated Tests: Static and Dynamic Characteristics
ISBN: 3110666642 ISBN-13(EAN): 9783110666649
Издательство: Walter de Gruyter
Цена: 86720.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:

This book offers an in-depth discussion related to metrological aspects of automated tests. The accuracy of experimental estimates of test object performance is examined from the standpoint of their statistical variance and systematic biases.

Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3030196763 ISBN-13(EAN): 9783030196769
Издательство: Springer
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Цена: 158380.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency.The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia.This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.

Автор: Ferrero
Название: Forensic Metrology
ISBN: 3031146182 ISBN-13(EAN): 9783031146183
Издательство: Springer
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Цена: 111790.00 T
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Описание: This book offers up-to-date information and guidance on the application of metrology in legal proceedings, clarifying the limits of validity of scientific evidence and presenting an illuminating series of case studies in which measurement uncertainty has played an important role. The fundamental concepts of metrology are discussed, and it is explained how metrology is capable of quantifying the reliability of measurement results and thereby contributing to appropriate decision making. With the aid of the presented case studies, this book will assist readers in understanding how legal decisions should be made in the presence of uncertainty. Areas covered in those studies include breath alcohol concentration analysis, and DNA profiling. Nowadays, decisions in most legal cases are based on evidence obtained through scientific analysis involving the acquisition of accurate measurements. Against this background, Forensic Metrology will be of value for lawyers and judges in both civil and common law countries, as well as engineers and other scientists with an interest in the subject.