Forensic Metrology, Ferrero

Автор: Wei Gao
Название: Metrology
ISBN: 9811049378 ISBN-13(EAN): 9789811049378
Издательство: Springer
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Цена: 372670.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.

Автор: Nawrocki Waldemar
Название: Introduction to Quantum Metrology: The Revised Si System and Quantum Standards
ISBN: 3030196798 ISBN-13(EAN): 9783030196790
Издательство: Springer
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Цена: 158380.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the theory of quantum effects used in metrology, and presents the author`s research findings in the field of quantum electronics.

Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3319384791 ISBN-13(EAN): 9783319384795
Издательство: Springer
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Цена: 104480.00 T
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Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.

Автор: Michael Quinten
Название: A Practical Guide to Surface Metrology
ISBN: 3030294536 ISBN-13(EAN): 9783030294533
Издательство: Springer
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Цена: 93160.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume i: foundations
ISBN: 1681746859 ISBN-13(EAN): 9781681746852
Издательство: Mare Nostrum (Eurospan)
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Цена: 72070.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

Автор: Tom Proulx
Название: Optical Measurements, Modeling, and Metrology, Volume 5
ISBN: 1461429056 ISBN-13(EAN): 9781461429050
Издательство: Springer
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Цена: 243800.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.

Автор: Krishnan, Kannan M.
Название: Principles of Materials Characterization and Metrology
ISBN: 0198830262 ISBN-13(EAN): 9780198830269
Издательство: Oxford Academ
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Цена: 46980.00 T
Наличие на складе: Нет в наличии.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1643270001 ISBN-13(EAN): 9781643270005
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 76690.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Автор: Yadav
Название: Recent Advances in Metrology
ISBN: 9811924678 ISBN-13(EAN): 9789811924675
Издательство: Springer
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Цена: 214280.00 T
Наличие на складе: Нет в наличии.
Описание: This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.

Автор: Sladek, Jerzy A.
Название: Coordinate metrology
ISBN: 3662484633 ISBN-13(EAN): 9783662484630
Издательство: Springer
Рейтинг:
Цена: 139310.00 T
Наличие на складе: Нет в наличии.
Описание: The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements.

Автор: Graham T. Smith
Название: Industrial Metrology
ISBN: 1849968780 ISBN-13(EAN): 9781849968782
Издательство: Springer
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Цена: 191550.00 T
Наличие на складе: Нет в наличии.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.

Автор: Sladek Jerzy A.
Название: Coordinate Metrology: Accuracy of Systems and Measurements
ISBN: 3662569248 ISBN-13(EAN): 9783662569245
Издательство: Springer
Рейтинг:
Цена: 158380.00 T
Наличие на складе: Нет в наличии.
Описание: The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements.