Название: Handbook of Optical Metrology ISBN: 1138112089 ISBN-13(EAN): 9781138112087 Издательство: Taylor&Francis Рейтинг: Цена: 83690.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals.
Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications.
With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien Название: Quantum Metrology, Imaging, and Communication ISBN: 331946549X ISBN-13(EAN): 9783319465494 Издательство: Springer Рейтинг: Цена: 111790.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Автор: Santoyo Название: Handbook Optical Metrology ISBN: 1420007920 ISBN-13(EAN): 9781420007923 Издательство: Taylor&Francis Цена: 75530.00 T Наличие на складе: Нет в наличии.
Автор: Raghavendra, N V; Krishnamurthy, L Название: Engineering Metrology and Measurements ISBN: 0198085494 ISBN-13(EAN): 9780198085492 Издательство: Oxford Academ Цена: 31670.00 T Наличие на складе: Поставка под заказ. Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Автор: Michael Quinten Название: A Practical Guide to Surface Metrology ISBN: 3030294536 ISBN-13(EAN): 9783030294533 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
Автор: Servin Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications ISBN: 3527411526 ISBN-13(EAN): 9783527411528 Издательство: Wiley Рейтинг: Цена: 125610.00 T Наличие на складе: Поставка под заказ. Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
Автор: Krishnan, Kannan M. Название: Principles of Materials Characterization and Metrology ISBN: 0198830262 ISBN-13(EAN): 9780198830269 Издательство: Oxford Academ Рейтинг: Цена: 41170.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Автор: Richard Leach Название: Advances in Optical Form and Coordinate Metrology ISBN: 0750325224 ISBN-13(EAN): 9780750325226 Издательство: INGRAM PUBLISHER SERVICES UK Рейтинг: Цена: 168960.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.
Автор: Wei Gao Название: Metrology ISBN: 9811049378 ISBN-13(EAN): 9789811049378 Издательство: Springer Рейтинг: Цена: 372670.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.
This volume is part of a handbook series that covers a comprehensive range of scientific and technological matters in ‘Precision Manufacturing’.
Автор: Waldemar Nawrocki Название: Introduction to Quantum Metrology ISBN: 3319384791 ISBN-13(EAN): 9783319384795 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.
Автор: Goebel Ernst O Название: Quantum Metrology ISBN: 3527412654 ISBN-13(EAN): 9783527412655 Издательство: Wiley Рейтинг: Цена: 105600.00 T Наличие на складе: Поставка под заказ. Описание: The International System of Units (SI) is the world`s most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)).
Автор: Nawrocki Waldemar Название: Introduction to Quantum Metrology: The Revised Si System and Quantum Standards ISBN: 3030196798 ISBN-13(EAN): 9783030196790 Издательство: Springer Рейтинг: Цена: 158380.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book discusses the theory of quantum effects used in metrology, and presents the author`s research findings in the field of quantum electronics.
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