Metrology of Automated Tests: Static and Dynamic Characteristics, Viacheslav Karmalita

Автор: Graham T. Smith
Название: Industrial Metrology
ISBN: 1849968780 ISBN-13(EAN): 9781849968782
Издательство: Springer
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Цена: 191550.00 T
Наличие на складе: Поставка под заказ.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.

Автор: Fran?ois Lanzetta
Название: Thermal Metrology
ISBN: 1786301601 ISBN-13(EAN): 9781786301604
Издательство: Wiley
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Цена: 133050.00 T
Наличие на складе: Невозможна поставка.

Автор: Shichang Du; Lifeng Xi
Название: High Definition Metrology Based Surface Quality Control and Applications
ISBN: 9811502781 ISBN-13(EAN): 9789811502781
Издательство: Springer
Рейтинг:
Цена: 93160.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides insights into surface quality control techniques and applications based on high-definition metrology (HDM). Intended as a reference resource for engineers who routinely use a variety of quality control methods and are interested in understanding the data processing, from HDM data to final control actions, it can also be used as a textbook for advanced courses in engineering quality control applications for students who are already familiar with quality control methods and practices. It enables readers to not only assimilate the quality control methods involved, but also to quickly implement the techniques in practical engineering problems. Further, it includes numerous case studies to highlight the implementation of the methods using measured HDM data of surface features. Since MATLAB is extensively employed in these case studies, familiarity with this software is helpful, as is a general understanding of surface quality control methods.

Автор: Vladimir T. Portman
Название: Mechanics of Accuracy in Engineering Design of Machines and Robots: Volume 2 Stiffness and Metrology
ISBN: 0791861694 ISBN-13(EAN): 9780791861691
Издательство: Mare Nostrum (Eurospan)
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Цена: 155230.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Accuracy provision, maintenance, and enhancement are hot problems in manufacturing and manufacturing science. This volume covers stiffness-compliance directly associated with the machine and robot accuracy through static deformations and computer-aided metrology aimed at final assessments of the accuracy-associated performance indexes.

Автор: Wei Gao
Название: Metrology
ISBN: 9811049378 ISBN-13(EAN): 9789811049378
Издательство: Springer
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Цена: 372670.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.

Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3319384791 ISBN-13(EAN): 9783319384795
Издательство: Springer
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Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.

Автор: Wei Gao
Название: Metrology
ISBN: 9811049386 ISBN-13(EAN): 9789811049385
Издательство: Springer
Рейтинг:
Цена: 372670.00 T
Наличие на складе: Поставка под заказ.
Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.

Автор: Fiorenzo Franceschini; Maurizio Galetto; Domenico
Название: Distributed Large-Scale Dimensional Metrology
ISBN: 1447158393 ISBN-13(EAN): 9781447158394
Издательство: Springer
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Цена: 130590.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The new idea of using WSNs for large-scale dimensional metrology has led to the design of distributed systems, subverting classic approaches and providing unique advantages such as portability and flexibility. This book explores the cutting edge in this field.

Название: Handbook of Silicon Semiconductor Metrology
ISBN: 0367397161 ISBN-13(EAN): 9780367397166
Издательство: Taylor&Francis
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Цена: 67360.00 T
Наличие на складе: Невозможна поставка.
Описание: Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay, acoustic film thickness, dopant dose, junction depth, and electrical measurements; particle and defect detection; and flatness following chemical mechanical polishing. Providing examples of well-developed metrology capability, the book focuses on metrology for lithography, transistor, capacitor, and on-chip interconnect process technologies.

Автор: Balasubramanian Muralikrishnan; Jayaraman Raja
Название: Computational Surface and Roundness Metrology
ISBN: 1849967733 ISBN-13(EAN): 9781849967730
Издательство: Springer
Рейтинг:
Цена: 113180.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.