Advances in Metrology for X-Ray and EUV Optics VI, Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VII
ISBN: 1510612270 ISBN-13(EAN): 9781510612273
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Sen Han, Toru Yoshizawa, Song Zhang
Название: Optical Metrology and Inspection for Industrial Applications IV
ISBN: 1510604650 ISBN-13(EAN): 9781510604650
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VII
ISBN: 1510618457 ISBN-13(EAN): 9781510618459
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Erik Novak, James Trolinger
Название: Applied Optical Metrology II
ISBN: 1510612033 ISBN-13(EAN): 9781510612037
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Название: Metrology, Inspection, and Process Control for Microlithography XXXII
ISBN: 1510616624 ISBN-13(EAN): 9781510616622
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Bernd Bodermann, Karsten Frenner, Richard M. Silver
Название: Modeling Aspects in Optical Metrology VI
ISBN: 1510611053 ISBN-13(EAN): 9781510611054
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
ISBN: 1510606793 ISBN-13(EAN): 9781510606791
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Malgorzata Kujawi?ska, Leszek Jaroszewicz
Название: Speckle 2018: VII International Conference on Speckle Metrology
ISBN: 1510622977 ISBN-13(EAN): 9781510622975
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kevin G. Harding
Название: Practical Optical Dimensional Metrology
ISBN: 1510622934 ISBN-13(EAN): 9781510622937
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Описание: Practical Optical Dimensional Metrology provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods that use: light level changes, two-dimensional imaging, triangulation, structured-light patterns, interference patterns, optical focus, light characteristics such as polarization, and hybrid methods with mechanical or other measurement tools. The book concludes with a series of manufacturing application examples that look at measurements from the centimeter range down to the nanometer range.

Автор: Sven Schroder, Roland Geyl
Название: Optical Fabrication, Testing, and Metrology VI
ISBN: 1510619216 ISBN-13(EAN): 9781510619210
Издательство: Mare Nostrum (Eurospan)
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Цена: 107190.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.