Metrology, Inspection, and Process Control for Microlithography XXXII, 

Автор: Andreas Erdmann
Название: Optical Microlithography XXX
ISBN: 1510607455 ISBN-13(EAN): 9781510607453
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Martha Sanchez
Название: Metrology, Inspection, and Process Control for Microlithography XXXI
ISBN: 1510607412 ISBN-13(EAN): 9781510607415
Издательство: Mare Nostrum (Eurospan)
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Цена: 168170.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Jongwook Kye
Название: Optical Microlithography XXXI
ISBN: 1510616667 ISBN-13(EAN): 9781510616660
Издательство: Mare Nostrum (Eurospan)
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Цена: 107190.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sen Han, Toru Yoshizawa, Song Zhang
Название: Optical Metrology and Inspection for Industrial Applications IV
ISBN: 1510604650 ISBN-13(EAN): 9781510604650
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VII
ISBN: 1510618457 ISBN-13(EAN): 9781510618459
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
ISBN: 1510606793 ISBN-13(EAN): 9781510606791
Издательство: Mare Nostrum (Eurospan)
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Цена: 121970.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VI
ISBN: 1510603158 ISBN-13(EAN): 9781510603158
Издательство: Mare Nostrum (Eurospan)
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Цена: 60990.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.