Practical Optical Dimensional Metrology, Kevin G. Harding

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VII
ISBN: 1510618457 ISBN-13(EAN): 9781510618459
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Oliv?rio D.D. Soares
Название: Optical Metrology
ISBN: 9401081158 ISBN-13(EAN): 9789401081153
Издательство: Springer
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Цена: 81050.00 T
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Описание: Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984

Автор: Bernd Bodermann, Karsten Frenner, Richard M. Silver
Название: Modeling Aspects in Optical Metrology VI
ISBN: 1510611053 ISBN-13(EAN): 9781510611054
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Erik Novak, James Trolinger
Название: Applied Optical Metrology II
ISBN: 1510612033 ISBN-13(EAN): 9781510612037
Издательство: Mare Nostrum (Eurospan)
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Цена: 81310.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sven Schroder, Roland Geyl
Название: Optical Fabrication, Testing, and Metrology VI
ISBN: 1510619216 ISBN-13(EAN): 9781510619210
Издательство: Mare Nostrum (Eurospan)
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Цена: 107190.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sen Han, Toru Yoshizawa, Song Zhang
Название: Optical Metrology and Inspection for Industrial Applications IV
ISBN: 1510604650 ISBN-13(EAN): 9781510604650
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.