Metrology, Inspection, and Process Control for Microlithography XXXI, Martha Sanchez

Название: Metrology, Inspection, and Process Control for Microlithography XXXII
ISBN: 1510616624 ISBN-13(EAN): 9781510616622
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Jongwook Kye
Название: Optical Microlithography XXXI
ISBN: 1510616667 ISBN-13(EAN): 9781510616660
Издательство: Mare Nostrum (Eurospan)
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Цена: 107190.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Andreas Erdmann
Название: Optical Microlithography XXX
ISBN: 1510607455 ISBN-13(EAN): 9781510607453
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sen Han, Toru Yoshizawa, Song Zhang
Название: Optical Metrology and Inspection for Industrial Applications IV
ISBN: 1510604650 ISBN-13(EAN): 9781510604650
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VII
ISBN: 1510618457 ISBN-13(EAN): 9781510618459
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Malgorzata Kujawi?ska, Leszek Jaroszewicz
Название: Speckle 2018: VII International Conference on Speckle Metrology
ISBN: 1510622977 ISBN-13(EAN): 9781510622975
Издательство: Mare Nostrum (Eurospan)
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Цена: 134910.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VII
ISBN: 1510612270 ISBN-13(EAN): 9781510612273
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
Издательство: Mare Nostrum (Eurospan)
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Цена: 132130.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.