Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI, Selim Shahriar, Jacob Scheuer

Автор: Selim Shahriar, Jacob Scheuer
Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
ISBN: 1510606793 ISBN-13(EAN): 9781510606791
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 121970.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kai-Erik Peiponen; Erik M. Vartiainen; Toshimitsu
Название: Dispersion, Complex Analysis and Optical Spectroscopy
ISBN: 3642084184 ISBN-13(EAN): 9783642084188
Издательство: Springer
Рейтинг:
Цена: 172350.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is devoted to dispersion theory in linear and nonlinear optics. Dispersion relations and methods of analysis in optical spectroscopy are derived with the aid of complex analysis. In addition, it presents the dispersion theory of the nonlinear optical processes which are essential in modern optical spectroscopy.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VI
ISBN: 1510603158 ISBN-13(EAN): 9781510603158
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 60990.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Kevin G. Harding
Название: Practical Optical Dimensional Metrology
ISBN: 1510622934 ISBN-13(EAN): 9781510622937
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 56850.00 T
Наличие на складе: Невозможна поставка.
Описание: Practical Optical Dimensional Metrology provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods that use: light level changes, two-dimensional imaging, triangulation, structured-light patterns, interference patterns, optical focus, light characteristics such as polarization, and hybrid methods with mechanical or other measurement tools. The book concludes with a series of manufacturing application examples that look at measurements from the centimeter range down to the nanometer range.

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Vladimir M. Agranovich; V. Ginzburg
Название: Crystal Optics with Spatial Dispersion, and Excitons
ISBN: 366202408X ISBN-13(EAN): 9783662024089
Издательство: Springer
Рейтинг:
Цена: 95770.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Spatial dispersion, namely, the dependence of the dielectric-constant tensor on the wave vector (i.e., on the wavelength) at a fixed frequency, is receiving increased attention in electrodynamics and condensed-matter optics, partic- ularly in crystal optics.

Автор: Oliv?rio D.D. Soares
Название: Optical Metrology
ISBN: 9401081158 ISBN-13(EAN): 9789401081153
Издательство: Springer
Рейтинг:
Цена: 81050.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984