Название: Metrology, Inspection, and Process Control for Microlithography XXXII ISBN: 1510616624 ISBN-13(EAN): 9781510616622 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 168170.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Martha Sanchez Название: Metrology, Inspection, and Process Control for Microlithography XXXI ISBN: 1510607412 ISBN-13(EAN): 9781510607415 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 168170.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Jongwook Kye Название: Optical Microlithography XXXI ISBN: 1510616667 ISBN-13(EAN): 9781510616660 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 107190.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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