Автор: Ravi K. Gulati; Charles F. Hawkins Название: IDDQ Testing of VLSI Circuits ISBN: 1461363772 ISBN-13(EAN): 9781461363774 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.
Автор: Ravi K. Gulati; Charles F. Hawkins Название: IDDQ Testing of VLSI Circuits ISBN: 0792393155 ISBN-13(EAN): 9780792393153 Издательство: Springer Рейтинг: Цена: 121110.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient`s temperature to determine the state of health.
Автор: S. Chakravarty; Paul J. Thadikaran Название: Introduction to IDDQ Testing ISBN: 0792399455 ISBN-13(EAN): 9780792399452 Издательство: Springer Рейтинг: Цена: 204040.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 174130.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
Автор: Andrei Pavlov; Manoj Sachdev Название: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ISBN: 904817855X ISBN-13(EAN): 9789048178551 Издательство: Springer Рейтинг: Цена: 130590.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
Автор: Paul Pop; Wajid Hassan Minhass; Jan Madsen Название: Microfluidic Very Large Scale Integration (VLSI) ISBN: 3319295977 ISBN-13(EAN): 9783319295978 Издательство: Springer Рейтинг: Цена: 107130.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Coverage includes a topology graph-based model for the biochip architecture, and a sequencing graph to model for biochemical application, showing how the application model can be obtained from the protocol language.
Автор: Ndjountche Название: CMOS Analog Integrated Circuits ISBN: 1138076856 ISBN-13(EAN): 9781138076853 Издательство: Taylor&Francis Рейтинг: Цена: 86760.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
High-speed, power-efficient analog integrated circuits can be used as standalone devices or to interface modern digital signal processors and micro-controllers in various applications, including multimedia, communication, instrumentation, and control systems. New architectures and low device geometry of complementary metaloxidesemiconductor (CMOS) technologies have accelerated the movement toward system on a chip design, which merges analog circuits with digital, and radio-frequency components. CMOS: Analog Integrated Circuits: High-Speed and Power-Efficient Design describes the important trends in designing these analog circuits and provides a complete, in-depth examination of design techniques and circuit architectures, emphasizing practical aspects of integrated circuit implementation.
Focusing on designing and verifying analog integrated circuits, the author reviews design techniques for more complex components such as amplifiers, comparators, and multipliers. The book details all aspects, from specification to the final chip, of the development and implementation process of filters, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), phase-locked loops (PLLs), and delay-locked loops (DLLs). It also describes different equivalent transistor models, design and fabrication considerations for high-density integrated circuits in deep-submicrometer process, circuit structures for the design of current mirrors and voltage references, topologies of suitable amplifiers, continuous-time and switched-capacitor circuits, modulator architectures, and approaches to improve linearity of Nyquist converters. The text addresses the architectures and performance limitation issues affecting circuit operation and provides conceptual and practical solutions to problems that can arise in the design process.
This reference provides balanced coverage of theoretical and practical issues that will allow the reader to design CMOS analog integrated circuits with improved electrical performance. The chapters contain easy-to-follow mathematical derivations of all equations and formulas, graphical plots, and open-ended design problems to help determine most suitable architecture for a given set of performance specifications. This comprehensive and illustrative text for the design and analysis of CMOS analog integrated circuits serves as a valuable resource for analog circuit designers and graduate students in electrical engineering.
Автор: Chattopadhyay, Santanu (department Of Electronics And Electrical Communication Engineering, Indian Institute Of Technology Kharagpur, West Bengal, Ind Название: Thermal-aware testing of digital vlsi circuits and systems ISBN: 0815378823 ISBN-13(EAN): 9780815378822 Издательство: Taylor&Francis Рейтинг: Цена: 63280.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
Автор: Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan Название: On-Line Testing for VLSI ISBN: 0792381327 ISBN-13(EAN): 9780792381327 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing.
Автор: Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan Название: On-Line Testing for VLSI ISBN: 1441950338 ISBN-13(EAN): 9781441950338 Издательство: Springer Рейтинг: Цена: 113180.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing.
Автор: Chattopadhyay, Santanu Название: Thermal-Aware Testing of Digital VLSI Circuits and Systems ISBN: 0367607093 ISBN-13(EAN): 9780367607098 Издательство: Taylor&Francis Рейтинг: Цена: 23470.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
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