On-Line Testing for VLSI, Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan

Автор: Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan
Название: On-Line Testing for VLSI
ISBN: 1441950338 ISBN-13(EAN): 9781441950338
Издательство: Springer
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Цена: 113180.00 T
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Описание: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing.

Автор: Ravi K. Gulati; Charles F. Hawkins
Название: IDDQ Testing of VLSI Circuits
ISBN: 1461363772 ISBN-13(EAN): 9781461363774
Издательство: Springer
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Цена: 93160.00 T
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Описание: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.

Автор: Ravi K. Gulati; Charles F. Hawkins
Название: IDDQ Testing of VLSI Circuits
ISBN: 0792393155 ISBN-13(EAN): 9780792393153
Издательство: Springer
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Цена: 121110.00 T
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Описание: For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient`s temperature to determine the state of health.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 174130.00 T
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: G?nter Grossmann; Christian Zardini
Название: The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
ISBN: 1447158407 ISBN-13(EAN): 9781447158400
Издательство: Springer
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Цена: 121890.00 T
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Описание: This book brings together contributions from the leading European experts in lead-free soldering. It offers comprehensive coverage of the scientific background and its applications in reliability testing of lead-free solder joints.

Автор: Dimitris Gizopoulos
Название: Advances in Electronic Testing
ISBN: 1489987738 ISBN-13(EAN): 9781489987730
Издательство: Springer
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Цена: 174130.00 T
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Описание: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Автор: Hans-Joachim Wunderlich
Название: Models in Hardware Testing
ISBN: 9400730934 ISBN-13(EAN): 9789400730939
Издательство: Springer
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Цена: 130430.00 T
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Описание: Model based testing is the most powerful technique for testing hardware and software systems. This book describes the use of models at all the levels of hardware testing. It includes a description of fault models for nanoscaled CMOS technology.

Автор: John T.L. Thong
Название: Electron Beam Testing Technology
ISBN: 1489915249 ISBN-13(EAN): 9781489915245
Издательство: Springer
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Цена: 174150.00 T
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Описание: Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.