On-Line Testing for VLSI, Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan

Автор: Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan
Название: On-Line Testing for VLSI
ISBN: 0792381327 ISBN-13(EAN): 9780792381327
Издательство: Springer
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Цена: 130610.00 T
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Описание: Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing.

Автор: Ravi K. Gulati; Charles F. Hawkins
Название: IDDQ Testing of VLSI Circuits
ISBN: 0792393155 ISBN-13(EAN): 9780792393153
Издательство: Springer
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Цена: 121110.00 T
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Описание: For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient`s temperature to determine the state of health.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 174130.00 T
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Angela Krstic; Kwang-Ting (Tim) Cheng
Название: Delay Fault Testing for VLSI Circuits
ISBN: 1461375614 ISBN-13(EAN): 9781461375616
Издательство: Springer
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Цена: 130610.00 T
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Описание: In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Автор: F. Lombardi; M.G. Sami
Название: Testing and Diagnosis of VLSI and ULSI
ISBN: 9401071349 ISBN-13(EAN): 9789401071345
Издательство: Springer
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Цена: 81050.00 T
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Описание: Proceedings of the NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI, Como, Italy, June 22-July 3, 1987

Автор: Ravi K. Gulati; Charles F. Hawkins
Название: IDDQ Testing of VLSI Circuits
ISBN: 1461363772 ISBN-13(EAN): 9781461363774
Издательство: Springer
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Цена: 93160.00 T
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Описание: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.

Автор: G?nter Grossmann; Christian Zardini
Название: The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
ISBN: 1447158407 ISBN-13(EAN): 9781447158400
Издательство: Springer
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Цена: 121890.00 T
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Описание: This book brings together contributions from the leading European experts in lead-free soldering. It offers comprehensive coverage of the scientific background and its applications in reliability testing of lead-free solder joints.

Автор: Dimitris Gizopoulos
Название: Advances in Electronic Testing
ISBN: 1489987738 ISBN-13(EAN): 9781489987730
Издательство: Springer
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Цена: 174130.00 T
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Описание: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.