Optical Scattering: Measurement and Analysis, John C. Stover

Автор: David Chenault, Dennis Goldstein
Название: Polarization: Measurement, Analysis, and Remote Sensing XIII
ISBN: 151061821X ISBN-13(EAN): 9781510618213
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 81310.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: David B. Chenault, Dennis Goldstein
Название: Polarization: Measurement, Analysis, and Remote Sensing XII
ISBN: 1510600949 ISBN-13(EAN): 9781510600942
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 81310.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Rick Trebino
Название: Frequency-Resolved Optical Gating: The Measurement of Ultrashort Laser Pulses
ISBN: 1461354323 ISBN-13(EAN): 9781461354321
Издательство: Springer
Рейтинг:
Цена: 148020.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Whether you`re an undergrad or an advanced researcher, you`ll find easy-to-understand descriptions of all the key ideas behind all the FROG techniques, all the practical details of pulse measurement, and many new directions of research.This book is not like any other scientific book.

Автор: Jigui Zhu, Hwa-Yaw Tam, Kexin Xu, Hai Xiao, Liquan Dong
Название: 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
ISBN: 1510617531 ISBN-13(EAN): 9781510617537
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 132130.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Peter Lehmann
Название: Optical Measurement Systems for Industrial Inspection X
ISBN: 1510611037 ISBN-13(EAN): 9781510611030
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 229150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sen Han, JiuBin Tan
Название: Optical Measurement Technology and Instrumentation
ISBN: 1510607684 ISBN-13(EAN): 9781510607682
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 172790.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Shinan Qian, Mourad Idir, Daniele Cocco, Tigiao Xiao, Kazuto Yamauchi
Название: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
ISBN: 1628419229 ISBN-13(EAN): 9781628419221
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 60990.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Jigui Zhu, Hwa-Yaw Tam, Kexin Xu, Hai Xiao, Sen Han
Название: 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
ISBN: 1628418044 ISBN-13(EAN): 9781628418040
Издательство: Mare Nostrum (Eurospan)
Цена: 91470.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sen Han, Jonathan D. Ellis, Junpeng Guo, Yongcai Guo
Название: AOPC 2015: Optical Test, Measurement, and Equipment
ISBN: 1628419024 ISBN-13(EAN): 9781628419023
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 132130.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Maciej Wojtkowski, Stephen A. Boppart, Wang-Yuhl Oh
Название: Optical Coherence Imaging Techniques and Imaging in Scattering Media II
ISBN: 1510612904 ISBN-13(EAN): 9781510612907
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 132130.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Brett Bouma, Maciej Wojtkowski
Название: Optical Coherence Imaging Techniques and Imaging in Scattering Media
ISBN: 1628417064 ISBN-13(EAN): 9781628417067
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 121970.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.