Polarization: Measurement, Analysis, and Remote Sensing XII, David B. Chenault, Dennis Goldstein

Автор: David Chenault, Dennis Goldstein
Название: Polarization: Measurement, Analysis, and Remote Sensing XIII
ISBN: 151061821X ISBN-13(EAN): 9781510618213
Издательство: Mare Nostrum (Eurospan)
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Цена: 81310.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Joseph Shaw, Daniel LeMaster
Название: Polarization Science and Remote Sensing VII
ISBN: 162841779X ISBN-13(EAN): 9781628417791
Издательство: Mare Nostrum (Eurospan)
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Цена: 91470.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: John C. Stover
Название: Optical Scattering: Measurement and Analysis
ISBN: 1628418400 ISBN-13(EAN): 9781628418408
Издательство: Mare Nostrum (Eurospan)
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Цена: 87780.00 T
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Описание: This third edition includes scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. New information on scatter from optically rough surfaces has also been added.

Автор: Joseph Shaw, Frans Snik
Название: Polarization Science and Remote Sensing VIII
ISBN: 1510612718 ISBN-13(EAN): 9781510612716
Издательство: Mare Nostrum (Eurospan)
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Цена: 91470.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.