Optical Measurement Systems for Industrial Inspection X, Peter Lehmann
Автор: Jigui Zhu, Hwa-Yaw Tam, Kexin Xu, Hai Xiao, Sen Han Название: 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ISBN: 1628418044 ISBN-13(EAN): 9781628418040 Издательство: Mare Nostrum (Eurospan) Цена: 91470.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Sen Han, Toru Yoshizawa, Song Zhang Название: Optical Metrology and Inspection for Industrial Applications IV ISBN: 1510604650 ISBN-13(EAN): 9781510604650 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 132130.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Jigui Zhu, Hwa-Yaw Tam, Kexin Xu, Hai Xiao, Liquan Dong Название: 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ISBN: 1510617531 ISBN-13(EAN): 9781510617537 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 132130.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Ryuichi Katayama, Yuzuru Takashima Название: Optical Data Storage 2018: Industrial Optical Devices and Systems ISBN: 1510620850 ISBN-13(EAN): 9781510620858 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 60990.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Pietro Ferraro, Simonetta Grilli, Monika Ritsch-Marte, Christoph K. Hitzenberger Название: Optical Methods for Inspection, Characterization, and Imaging of Biomaterials III ISBN: 1510611118 ISBN-13(EAN): 9781510611115 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 121970.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Rick Trebino Название: Frequency-Resolved Optical Gating: The Measurement of Ultrashort Laser Pulses ISBN: 1461354323 ISBN-13(EAN): 9781461354321 Издательство: Springer Рейтинг: Цена: 148020.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Whether you`re an undergrad or an advanced researcher, you`ll find easy-to-understand descriptions of all the key ideas behind all the FROG techniques, all the practical details of pulse measurement, and many new directions of research.This book is not like any other scientific book.
Автор: Lang Walter Название: Sensors and Measurement Systems ISBN: 877022028X ISBN-13(EAN): 9788770220286 Издательство: Taylor&Francis Рейтинг: Цена: 43890.00 T Наличие на складе: Нет в наличии. Описание:
Sensors and measurement systems is an introduction to microsensors for engineering students in the final undergraduate or early graduate level, technicians who wants to know more about the systems they are using, and anybody curious enough to know what microsystems and microsensors can do.
The book discusses five families of sensors:
Thermal sensors
Force and pressure sensors
Inertial sensors
Magnetic field sensors
Flow sensors
For each sensor, theoretical, technology and application aspects are examined. The sensor function is modelled to understand sensitivity, resolution and noise. We ask ourselves: What do we want to measure? What are possible applications? How are the sensor chips made in the cleanroom? How are they mounted and integrated in a system?
After reading this book, you should be able to:
Understand important thermal, mechanical, inertial and magnetic sensors
Work with characterization parameters for sensors
Choose sensors for a given application and apply them
Understand micromachining technologies for sensors
Автор: Sen Han, JiuBin Tan Название: Optical Measurement Technology and Instrumentation ISBN: 1510607684 ISBN-13(EAN): 9781510607682 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 172790.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: John C. Stover Название: Optical Scattering: Measurement and Analysis ISBN: 1628418400 ISBN-13(EAN): 9781628418408 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 87780.00 T Наличие на складе: Невозможна поставка. Описание: This third edition includes scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. New information on scatter from optically rough surfaces has also been added.
Автор: Sen Han, Jonathan D. Ellis, Junpeng Guo, Yongcai Guo Название: AOPC 2015: Optical Test, Measurement, and Equipment ISBN: 1628419024 ISBN-13(EAN): 9781628419023 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 132130.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
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