Автор: Kenneth Goldberg Название: Extreme Ultraviolet (EUV) Lithography IX ISBN: 1510616586 ISBN-13(EAN): 9781510616585 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 142290.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Eric Panning Название: Extreme Ultraviolet (EUV) Lithography VIII ISBN: 1510607374 ISBN-13(EAN): 9781510607378 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 142290.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Uwe Behringer, Jo Finders Название: 34th European Mask and Lithography Conference ISBN: 1510621210 ISBN-13(EAN): 9781510621213 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Kiwamu Takehisa Название: Photomask Japan 2018: XXV Symposium on Photomask and Next-Generation Lithography Mask Technology ISBN: 1510622012 ISBN-13(EAN): 9781510622012 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Kurt Ronse, Eric Hendrickx, Patrick Naulleau, Paolo Gargini, Toshiro Itani Название: International Conference on Extreme Ultraviolet Lithography 2018 ISBN: 1510622136 ISBN-13(EAN): 9781510622135 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 134910.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Uwe F.W. Behringer, Jo Finders Название: 33rd European Mask and Lithography Conference ISBN: 1510613560 ISBN-13(EAN): 9781510613560 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Kiwamu Takehisa Название: Photomask Japan 2017: XXIV Symposium on Photomask and Next-Generation Lithography Mask Technology ISBN: 1510613897 ISBN-13(EAN): 9781510613898 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 81310.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Ali M. Khounsary, Shunji Goto, Christian Morawe Название: Advances in X-Ray/EUV Optics and Components XI ISBN: 1510603174 ISBN-13(EAN): 9781510603172 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 81310.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi Название: Advances in Metrology for X-Ray and EUV Optics VI ISBN: 1510603158 ISBN-13(EAN): 9781510603158 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 60990.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Rene Hudec, Ladislav Pina Название: EUV and X-ray Optics: Synergy between Laboratory and Space V ISBN: 1510609717 ISBN-13(EAN): 9781510609716 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Libor Juha, Sasa Bajt, Regina Soufli Название: Damage to VUV, EUV, and X-ray Optics VI ISBN: 1510609733 ISBN-13(EAN): 9781510609730 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 60990.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Shunji Goto, Christian Morawe, Ali Khounsary Название: Advances in X-Ray/EUV Optics and Components XIII ISBN: 1510620915 ISBN-13(EAN): 9781510620919 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 60990.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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