Thermal Metrology, Fran?ois Lanzetta

Автор: Santoyo
Название: Handbook Optical Metrology
ISBN: 1420007920 ISBN-13(EAN): 9781420007923
Издательство: Taylor&Francis
Цена: 75530.00 T
Наличие на складе: Нет в наличии.

Автор: Raghavendra, N V; Krishnamurthy, L
Название: Engineering Metrology and Measurements
ISBN: 0198085494 ISBN-13(EAN): 9780198085492
Издательство: Oxford Academ
Цена: 31670.00 T
Наличие на складе: Поставка под заказ.
Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 132130.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Malgorzata Kujawi?ska, Leszek Jaroszewicz
Название: Speckle 2018: VII International Conference on Speckle Metrology
ISBN: 1510622977 ISBN-13(EAN): 9781510622975
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 134910.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sen Han, Toru Yoshizawa, Song Zhang
Название: Optical Metrology and Inspection for Industrial Applications IV
ISBN: 1510604650 ISBN-13(EAN): 9781510604650
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 132130.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VI
ISBN: 1510603158 ISBN-13(EAN): 9781510603158
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 60990.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Mansfield
Название: Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations
ISBN: 3527340394 ISBN-13(EAN): 9783527340392
Издательство: Wiley
Рейтинг:
Цена: 180520.00 T
Наличие на складе: Поставка под заказ.
Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

Автор: French College
Название: Metrology in Industry: The Key for Quality
ISBN: 1905209517 ISBN-13(EAN): 9781905209514
Издательство: Wiley
Рейтинг:
Цена: 146730.00 T
Наличие на складе: Поставка под заказ.
Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.

Автор: Itzal Zabala
Название: Modern Metrology Concerns
ISBN: 1681175312 ISBN-13(EAN): 9781681175317
Издательство: Gazelle Book Services
Рейтинг:
Цена: 230210.00 T
Наличие на складе: Невозможна поставка.
Описание: "Have you ever wondered how an inch became an inch, and why a kilo is not a pound? Do you know what the distance is between the earth and the sun in millimeters? These are questions that can only be answered if you learn more about metrology. Metrology covers both the experimental and theoretical aspects of measurement and the determination of the levels of uncertainty of these aspects. The study of measurement is a basic requirement in any field of science and technology, most importantly in engineering and manufacturing. Since metrology is the study of measurement, it is expected to enforce, validate and verify predefined standards for traceability, accuracy, reliability, and precision. All of these are factors that would affect the validity of measurement. Although these standards vary widely, these are mandated by the government, the agencies, and some treaties. Subsequently, these standards are verified and tested against a recognized quality system in calibration laboratories. The experimental aspect of metrology is that which deals with the investigation of the relationship among variables. These variables are established depending on set of observations being considered or classified. As such, it is in this aspect that hypotheses are established and tested. On the other hand, the theoretical aspect of metrology pacts with the various concepts and principles underlying the study. Modern Metrology Concerns provides comprehensive overview on the recent developments in the field of Metrology. Theoretical basis and applications are enlightened in accurate and comprehensive manner, providing a appreciated reference to researchers and professionals."

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications VI
ISBN: 1510609415 ISBN-13(EAN): 9781510609419
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Martha Sanchez
Название: Metrology, Inspection, and Process Control for Microlithography XXXI
ISBN: 1510607412 ISBN-13(EAN): 9781510607415
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 168170.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Sven Schroder, Roland Geyl
Название: Optical Fabrication, Testing, and Metrology VI
ISBN: 1510619216 ISBN-13(EAN): 9781510619210
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 107190.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.