Advances in X-Ray Analysis, K. Heinrich

Автор: Gavin R. Mallett; Marie Fay; William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476351 ISBN-13(EAN): 9781468476354
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476084 ISBN-13(EAN): 9781468476088
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.

Автор: S?rgio Luiz Morelh?o
Название: Computer Simulation Tools for X-ray Analysis
ISBN: 3319372963 ISBN-13(EAN): 9783319372969
Издательство: Springer
Рейтинг:
Цена: 60940.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research.

Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall
Название: Advances in X-Ray Analysis
ISBN: 1468475371 ISBN-13(EAN): 9781468475371
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.

Автор: William M. Mueller; Gavin R. Mallett; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848639X ISBN-13(EAN): 9781468486391
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.

Автор: William M. Mueller; Gavin Mallet; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 1468486756 ISBN-13(EAN): 9781468486759
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A real need exists for ways to bridge the gap between basic research and prac- tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish- ments to the civilian economy.

Автор: William M. Mueller; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848785X ISBN-13(EAN): 9781468487855
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: At the same time the researcher is faced with problems of in- creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest.

Автор: John B. Newkirk; Gavin R. Mallett
Название: Advances in X-Ray Analysis
ISBN: 1468478370 ISBN-13(EAN): 9781468478372
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses- sions, Professor R. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.

Автор: Burton Henke
Название: Advances in X-Ray Analysis
ISBN: 1461399653 ISBN-13(EAN): 9781461399650
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468474030 ISBN-13(EAN): 9781468474039
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.

Автор: D. K. Smith
Название: Advances in X-Ray Analysis
ISBN: 1461399920 ISBN-13(EAN): 9781461399926
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied.

Автор: Howard McMurdie
Название: Advances in X-ray Analysis
ISBN: 1461399831 ISBN-13(EAN): 9781461399834
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray diffraction as a method of qualitative analysis for crystal- line phases has been long accepted, and has had constant improvement in method and equipment.