Advances in X-Ray Analysis, William M. Mueller; Gavin Mallet; Marie Fay

Автор: John C. Russ
Название: Advances in X-Ray Analysis
ISBN: 1461399955 ISBN-13(EAN): 9781461399957
Издательство: Springer
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Цена: 46570.00 T
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Описание: In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif- fraction.

Автор: K. Heinrich
Название: Advances in X-Ray Analysis
ISBN: 1461399718 ISBN-13(EAN): 9781461399711
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Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468474030 ISBN-13(EAN): 9781468474039
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Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.

Автор: C. Grant
Название: Advances in X-Ray Analysis
ISBN: 1461399777 ISBN-13(EAN): 9781461399773
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Описание: The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data.

Автор: John B. Newkirk; Gavin R. Mallett; Heinz G. Pfeiff
Название: Advances in X-ray Analysis
ISBN: 1468486780 ISBN-13(EAN): 9781468486780
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Цена: 113190.00 T
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Описание: X-ray emission spectrography, while based on Moseley`s work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.

Автор: S?rgio Luiz Morelh?o
Название: Computer Simulation Tools for X-ray Analysis
ISBN: 3319372963 ISBN-13(EAN): 9783319372969
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Цена: 60940.00 T
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Описание: The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research.

Автор: Gavin R. Mallett; Marie Fay; William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476351 ISBN-13(EAN): 9781468476354
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Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476084 ISBN-13(EAN): 9781468476088
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Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.

Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall
Название: Advances in X-Ray Analysis
ISBN: 1468475371 ISBN-13(EAN): 9781468475371
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Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.

Автор: William M. Mueller; Gavin R. Mallett; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848639X ISBN-13(EAN): 9781468486391
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Цена: 104480.00 T
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Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.

Автор: Gregory J. McCarthy
Название: Advances in X-Ray Analysis
ISBN: 1461399890 ISBN-13(EAN): 9781461399896
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Цена: 87070.00 T
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Описание: In keeping with recent practice, this year`s Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.

Автор: William M. Mueller; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848785X ISBN-13(EAN): 9781468487855
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Цена: 46570.00 T
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Описание: At the same time the researcher is faced with problems of in- creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest.