Advances in X-Ray Analysis, John B. Newkirk; Gavin R. Mallett
Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall Название: Advances in X-Ray Analysis ISBN: 1468475371 ISBN-13(EAN): 9781468475371 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468486330 ISBN-13(EAN): 9781468486339 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468474030 ISBN-13(EAN): 9781468474039 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.
Автор: C. Grant Название: Advances in X-Ray Analysis ISBN: 1461399777 ISBN-13(EAN): 9781461399773 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data.
Автор: D. K. Smith Название: Advances in X-Ray Analysis ISBN: 1461399920 ISBN-13(EAN): 9781461399926 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied.
Автор: Howard McMurdie Название: Advances in X-ray Analysis ISBN: 1461399831 ISBN-13(EAN): 9781461399834 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: X-ray diffraction as a method of qualitative analysis for crystal- line phases has been long accepted, and has had constant improvement in method and equipment.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468486365 ISBN-13(EAN): 9781468486360 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The Ninth Annual Conference on Applications of X-Ray Anal- ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado.
Автор: H. Van Olphen Название: X-Ray and Electron Methods of Analysis ISBN: 1489959157 ISBN-13(EAN): 9781489959157 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Gavin R. Mallett; Marie Fay; William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468476351 ISBN-13(EAN): 9781468476354 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.
Автор: William M. Mueller Название: Advances in X-Ray Analysis ISBN: 1468476084 ISBN-13(EAN): 9781468476088 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.
Автор: William M. Mueller; Gavin Mallet; Marie Fay Название: Advances in X-Ray Analysis ISBN: 1468486756 ISBN-13(EAN): 9781468486759 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: A real need exists for ways to bridge the gap between basic research and prac- tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish- ments to the civilian economy.
Автор: William M. Mueller; Marie Fay Название: Advances in X-Ray Analysis ISBN: 146848785X ISBN-13(EAN): 9781468487855 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: At the same time the researcher is faced with problems of in- creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest.
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