Advances in X-Ray Analysis, Charles S. Barrett; John B. Newkirk; Gavin R. Mall

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468474030 ISBN-13(EAN): 9781468474039
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Описание: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com- munity, a versatility limited only by the imagination and inge- nuity of the scientist, the designer of X-ray equipment, and the novice or student.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468486365 ISBN-13(EAN): 9781468486360
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Описание: The Ninth Annual Conference on Applications of X-Ray Anal- ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado.

Автор: Gavin R. Mallett; Marie Fay; William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476351 ISBN-13(EAN): 9781468476354
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Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476084 ISBN-13(EAN): 9781468476088
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Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.

Автор: William M. Mueller; Gavin R. Mallett; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848639X ISBN-13(EAN): 9781468486391
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Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.

Автор: William M. Mueller; Gavin Mallet; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 1468486756 ISBN-13(EAN): 9781468486759
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Описание: A real need exists for ways to bridge the gap between basic research and prac- tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish- ments to the civilian economy.

Автор: Burton Henke
Название: Advances in X-Ray Analysis
ISBN: 1461399653 ISBN-13(EAN): 9781461399650
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Описание: Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy.

Автор: K. Heinrich
Название: Advances in X-Ray Analysis
ISBN: 1461399718 ISBN-13(EAN): 9781461399711
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Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.

Автор: D. K. Smith
Название: Advances in X-Ray Analysis
ISBN: 1461399920 ISBN-13(EAN): 9781461399926
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Описание: Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied.

Автор: Howard McMurdie
Название: Advances in X-ray Analysis
ISBN: 1461399831 ISBN-13(EAN): 9781461399834
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Описание: X-ray diffraction as a method of qualitative analysis for crystal- line phases has been long accepted, and has had constant improvement in method and equipment.

Автор: John B. Newkirk; Gavin R. Mallett; Heinz G. Pfeiff
Название: Advances in X-ray Analysis
ISBN: 1468486780 ISBN-13(EAN): 9781468486780
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Описание: X-ray emission spectrography, while based on Moseley`s work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago.

Автор: H. Van Olphen
Название: X-Ray and Electron Methods of Analysis
ISBN: 1489959157 ISBN-13(EAN): 9781489959157
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