Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures, Bella B. Smoliar; Victor A. Drits

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
Рейтинг:
Цена: 130610.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: P.K. Larsen; P.J. Dobson
Название: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
ISBN: 1468455826 ISBN-13(EAN): 9781468455823
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987

Автор: Michel A. VanHove; William Henry Weinberg; Chi-Min
Название: Low-Energy Electron Diffraction
ISBN: 3642827233 ISBN-13(EAN): 9783642827235
Издательство: Springer
Рейтинг:
Цена: 74010.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Surface crystallography plays the same fundamental role in surface science which bulk crystallography has played so successfully in solid-state physics and chemistry.

Автор: Zhong-lin Wang
Название: Elastic and Inelastic Scattering in Electron Diffraction and Imaging
ISBN: 1489915818 ISBN-13(EAN): 9781489915818
Издательство: Springer
Рейтинг:
Цена: 191560.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.

Автор: Max Gulde
Название: Development of an Ultrafast Low-Energy Electron Diffraction Setup
ISBN: 3319185608 ISBN-13(EAN): 9783319185606
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films.

Автор: B. B. Zvyagin
Название: Electron-Diffraction Analysis of Clay Mineral Structures
ISBN: 1461586143 ISBN-13(EAN): 9781461586142
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: As a method of structure analysis, electron diffraction has its own spe- cial possibilities and advantages in comparison to the X -ray method for the study of finely dispersed minerals with layer or pseudolayer structures.

Автор: Henning Friis Poulsen
Название: Three-Dimensional X-Ray Diffraction Microscopy
ISBN: 366214543X ISBN-13(EAN): 9783662145432
Издательство: Springer
Рейтинг:
Цена: 149060.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G
Название: X-Ray Diffraction by Disordered Lamellar Structures
ISBN: 364274804X ISBN-13(EAN): 9783642748042
Издательство: Springer
Рейтинг:
Цена: 95770.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.