Electron-Diffraction Analysis of Clay Mineral Structures, B. B. Zvyagin

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Цена: 130610.00 T
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: Bella B. Smoliar; Victor A. Drits
Название: Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
ISBN: 3642717314 ISBN-13(EAN): 9783642717314
Издательство: Springer
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Цена: 95770.00 T
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Описание: By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book.

Автор: Hammond, Christopher
Название: The Basics of Crystallography and Diffraction
ISBN: 0198738684 ISBN-13(EAN): 9780198738688
Издательство: Oxford Academ
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Цена: 53850.00 T
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Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.

Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G
Название: X-Ray Diffraction by Disordered Lamellar Structures
ISBN: 364274804X ISBN-13(EAN): 9783642748042
Издательство: Springer
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Цена: 95770.00 T
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Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.