X-Ray Diffraction by Disordered Lamellar Structures, Victor A. Drits; Gerard Besson; R. Setton; Andre G
Автор: Will Georg Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data ISBN: 3540279857 ISBN-13(EAN): 9783540279853 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Автор: Binder, Kurt Kob, Walter Название: Glassy materials and disordered solids ISBN: 9814350176 ISBN-13(EAN): 9789814350174 Издательство: World Scientific Publishing Рейтинг: Цена: 99270.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: An introduction to the physics of amorphous solids and related disordered condensed matter systems. It explains important concepts from statistical mechanics such as percolation, random walks, fractals and spin glasses. It also includes material on topics in the field of disordered systems such as gels, driven systems, and growing length scales.
Автор: Bella B. Smoliar; Victor A. Drits Название: Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures ISBN: 3642717314 ISBN-13(EAN): 9783642717314 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book.
Автор: B. B. Zvyagin Название: Electron-Diffraction Analysis of Clay Mineral Structures ISBN: 1461586143 ISBN-13(EAN): 9781461586142 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: As a method of structure analysis, electron diffraction has its own spe- cial possibilities and advantages in comparison to the X -ray method for the study of finely dispersed minerals with layer or pseudolayer structures.
Автор: Oleg A. Glebov; Mikhail A. Krivoglaz Название: X-Ray and Neutron Diffraction in Nonideal Crystals ISBN: 3642742939 ISBN-13(EAN): 9783642742934 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.
Автор: Henning Friis Poulsen Название: Three-Dimensional X-Ray Diffraction Microscopy ISBN: 366214543X ISBN-13(EAN): 9783662145432 Издательство: Springer Рейтинг: Цена: 149060.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Автор: Hammond, Christopher Название: The Basics of Crystallography and Diffraction ISBN: 0198738684 ISBN-13(EAN): 9780198738688 Издательство: Oxford Academ Рейтинг: Цена: 53850.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.
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