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Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 85010.00 T Наличие на складе: Есть Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Merin Sara Thomas Название: Advanced microscopy : ISBN: 177491042X ISBN-13(EAN): 9781774910429 Издательство: Taylor&Francis Рейтинг: Цена: 133730.00 T Наличие на складе: Нет в наличии. Описание: This interdisciplinary book covers the methodology and applications of different advanced microscopic techniques in various research fields, including chemistry, nanotechnology, chemical engineering, and biomedical engineering, providing an informative overview that helps to determine the best applications for advanced materials.
Автор: J.K. Koehler; A.P. Aguas; M.F. Barbosa; R.P. Bolen Название: Advanced Techniques in Biological Electron Microscopy III ISBN: 3540164006 ISBN-13(EAN): 9783540164005 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This volume is a continuation of two prior books on advanced electron microscope techniques. The mission of the present volume remains that of a source book for the research practitioner or advanced student, especially one already well versed in basic electron optical methods.
Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena Название: Advanced Transmission Electron Microscopy ISBN: 3319151762 ISBN-13(EAN): 9783319151762 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.
Автор: Jian Min Zuo; John C.H. Spence Название: Advanced Transmission Electron Microscopy ISBN: 1493982494 ISBN-13(EAN): 9781493982493 Издательство: Springer Рейтинг: Цена: 83850.00 T Наличие на складе: Нет в наличии. Описание: As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.
Название: Advanced fluorescence microscopy ISBN: 1493920790 ISBN-13(EAN): 9781493920792 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Nechyporuk-Zloy Название: Principles of Light Microscopy: From Basic to Advanced ISBN: 3031044762 ISBN-13(EAN): 9783031044762 Издательство: Springer Рейтинг: Цена: 55890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This textbook is an excellent guide to microscopy for students and scientists, who use microscopy as one of their primary research and analysis tool in the laboratory. The book covers key microscopy principles and explains the various techniques such as epifluorescence microscopy, confocal/live cell imaging, SIM/light sheet microscopy, and many more. Easy-to-understand protocols provide helpful guidance for practical implementation in various commercially available imaging systems. The reader is introduced to histology and further be guided through advanced image acquisition, classification and analysis. The book is written by experienced imaging specialists from the UK, other EU countries, the US and Asia, and is based on advanced training courses for master students and PhD students. Readers are not expected to be familiar with imaging and microscopy technologies, but are introduced to the subject step by step. This textbook is indented for biomedical and medical students, as well as scientists and postdocs who want to acquire a thorough knowledge of microscopy, or gain a comprehensive overview of modern microscopy techniques used in various research laboratories and imaging facilities. Chapter 4 is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.
Автор: Haugstad Название: Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications ISBN: 0470638826 ISBN-13(EAN): 9780470638828 Издательство: Wiley Рейтинг: Цена: 139340.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).
Автор: de Buffr?nil, Vivian ; de Ricql?s, Armand J ; Zylb Название: Vertebrate Skeletal Histology and Paleohistology ISBN: 0367700867 ISBN-13(EAN): 9780367700867 Издательство: Taylor&Francis Рейтинг: Цена: 88800.00 T Наличие на складе: Нет в наличии.
Автор: Thomas Vogt; Wolfgang Dahmen; Peter Binev Название: Modeling Nanoscale Imaging in Electron Microscopy ISBN: 1489997288 ISBN-13(EAN): 9781489997289 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
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