Microscopy Applied to Materials Sciences and Life Sciences, Vasudeo Rane, Ajay
Автор: Merin Sara Thomas Название: Advanced microscopy : ISBN: 177491042X ISBN-13(EAN): 9781774910429 Издательство: Taylor&Francis Рейтинг: Цена: 133730.00 T Наличие на складе: Нет в наличии. Описание: This interdisciplinary book covers the methodology and applications of different advanced microscopic techniques in various research fields, including chemistry, nanotechnology, chemical engineering, and biomedical engineering, providing an informative overview that helps to determine the best applications for advanced materials.
Автор: Neha Kanwar Rawat, Tatiana G. Volova, A. Название: Applied Biopolymer Technology and Bioplastics ISBN: 177463774X ISBN-13(EAN): 9781774637746 Издательство: Taylor&Francis Рейтинг: Цена: 84710.00 T Наличие на складе: Нет в наличии. Описание: This volume, Applied Biopolymer Technology and Bioplastics: Sustainable Development by Green Engineering Materials, will be valuable for a broad audience of engineers and scientists, especially those designing with biopolymers and biodegradable plastics, or evaluating the options for switching from traditional plastics to biopolymers.
Автор: Torquato S. Название: Random Heterogeneous Materials ISBN: 0387951679 ISBN-13(EAN): 9780387951676 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Нет в наличии. Описание: The overall aim of this book is to provide a rigorous means to characterize the microstructure and properties of heterogeneous materials that can simultaneously yield results of practical utility. A unified treatment of both microstructure and properties is emphasized. The book is divided into two parts. Part I deals with the quantitative characterization of the microstructure of heterogeneous via theoretical, computer-simulation and imaging techniques. Emphasis is placed on theoretical methods. Part II treats a wide variety of effective properties of heterogeneous materials and how they are linked to the microstructure. This is accomplished using rigorous methods. Wherever possible, theoretical predictions for the effective properties are compared to available, experimental and computer-simulation data. This book will be of interest to graduate students and researchers in applied mathematics, physics, chemistry, materials science and engineering.
Автор: Joseph Goldstein Название: Practical Scanning Electron Microscopy ISBN: 1461344247 ISBN-13(EAN): 9781461344247 Издательство: Springer Рейтинг: Цена: 113190.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401786003 ISBN-13(EAN): 9789401786003 Издательство: Springer Рейтинг: Цена: 69870.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Автор: Weilie Zhou; Zhong Lin Wang Название: Scanning Microscopy for Nanotechnology ISBN: 1441922091 ISBN-13(EAN): 9781441922090 Издательство: Springer Рейтинг: Цена: 139310.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat Название: Bringing Scanning Probe Microscopy up to Speed ISBN: 0792384660 ISBN-13(EAN): 9780792384663 Издательство: Springer Рейтинг: Цена: 139750.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
Автор: Cullis, A.G Название: Microscopy of Semiconducting Materials ISBN: 0750306505 ISBN-13(EAN): 9780750306508 Издательство: Taylor&Francis Рейтинг: Цена: 535920.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 3319398768 ISBN-13(EAN): 9783319398761 Издательство: Springer Рейтинг: Цена: 74530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Автор: J. McCall Название: Metallographic Specimen Preparation ISBN: 1461587107 ISBN-13(EAN): 9781461587101 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Now he has elec- tron microscopes, scanning electron microscopes, and a whole host of instruments which were unknown to him only a relatively few years ago.
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