Modeling Nanoscale Imaging in Electron Microscopy, Thomas Vogt; Wolfgang Dahmen; Peter Binev

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 130610.00 T
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Автор: Murphy Douglas B. , Davidson Michael W.
Название: Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition
ISBN: 047169214X ISBN-13(EAN): 9780471692140
Издательство: Wiley
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Цена: 144620.00 T
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Описание: Fundamentals of Light Microscopy and Electronic Imaging, Second Edition provides a coherent introduction to the principles and applications of the integrated optical microscope system, covering both theoretical and practical considerations.

Автор: Zewail, A.H.
Название: 4D Electron Microscopy
ISBN: 1848164009 ISBN-13(EAN): 9781848164000
Издательство: World Scientific Publishing
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Цена: 42240.00 T
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Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 93160.00 T
Наличие на складе: Невозможна поставка.
Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 121890.00 T
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 97820.00 T
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 93130.00 T
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Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Автор: Watkins
Название: Current Protocols Select: Methods and Applications in Microscopy and Imaging
ISBN: 1118044312 ISBN-13(EAN): 9781118044315
Издательство: Wiley
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Цена: 129890.00 T
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Описание: The advanced light microscope is a highly sophisticated robotic tool which, when coupled with appropriate detectors and image processing, allows scientists to investigate the inner workings of biological systems from the single molecule, through cells, to

Автор: Erni Rolf
Название: Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)
ISBN: 1783265280 ISBN-13(EAN): 9781783265282
Издательство: World Scientific Publishing
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Цена: 96090.00 T
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Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.