Low Voltage Electron Microscopy - Principles and Applications, Bell
Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 85010.00 T Наличие на складе: Есть Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Callaghan, Paul Название: Principles of nuclear magnetic resonance microscopy ISBN: 0198539975 ISBN-13(EAN): 9780198539971 Издательство: Oxford Academ Рейтинг: Цена: 108240.00 T Наличие на складе: Нет в наличии. Описание: This highly successful book, details the underlying principles behind the use of magnetic field gradients to image molecular distribution and molecular motion, providing many examples by way of illustration. Following excellent reviews of the hardback edition the book is now available in paperback.
Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie Название: Scanning Tunneling Microscopy I ISBN: 3540584153 ISBN-13(EAN): 9783540584155 Издательство: Springer Рейтинг: Цена: 60940.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur- rent, which flows on application of a bias voltage, to sense the atomic and elec- tronic surface structure with atomic resolution!
Автор: Dimitry N. Frolov Название: Microscope Design: Volume 1: Principles ISBN: 1510639934 ISBN-13(EAN): 9781510639935 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 66880.00 T Наличие на складе: Нет в наличии. Описание: Traces the historical development of microscopy instruments from their invention to the current state of the art. New concepts and engineering solutions are presented for modern light microscopes, with a focus on the practical construction of optical systems. Real design parameters of dioptric objectives and other systems are provided.
Автор: Nechyporuk-Zloy Название: Principles of Light Microscopy: From Basic to Advanced ISBN: 3031044762 ISBN-13(EAN): 9783031044762 Издательство: Springer Рейтинг: Цена: 55890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This textbook is an excellent guide to microscopy for students and scientists, who use microscopy as one of their primary research and analysis tool in the laboratory. The book covers key microscopy principles and explains the various techniques such as epifluorescence microscopy, confocal/live cell imaging, SIM/light sheet microscopy, and many more. Easy-to-understand protocols provide helpful guidance for practical implementation in various commercially available imaging systems. The reader is introduced to histology and further be guided through advanced image acquisition, classification and analysis. The book is written by experienced imaging specialists from the UK, other EU countries, the US and Asia, and is based on advanced training courses for master students and PhD students. Readers are not expected to be familiar with imaging and microscopy technologies, but are introduced to the subject step by step. This textbook is indented for biomedical and medical students, as well as scientists and postdocs who want to acquire a thorough knowledge of microscopy, or gain a comprehensive overview of modern microscopy techniques used in various research laboratories and imaging facilities. Chapter 4 is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.
Автор: Scalettar, Bethe A. Название: Introductory Biomedical Imaging ISBN: 1032328193 ISBN-13(EAN): 9781032328195 Издательство: Taylor&Francis Рейтинг: Цена: 117390.00 T Наличие на складе: Нет в наличии.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401786003 ISBN-13(EAN): 9789401786003 Издательство: Springer Рейтинг: Цена: 69870.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Автор: Liu, Jian Tan, Jiubin Название: Confocal microscopy ISBN: 1681743361 ISBN-13(EAN): 9781681743363 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 41580.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.
Автор: Page Lisa Название: Scanning Electron Microscopy ISBN: 163238406X ISBN-13(EAN): 9781632384065 Издательство: Неизвестно Цена: 153270.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.
Автор: Page Lisa Название: Handbook of Transmission Electron Microscopy ISBN: 1632382830 ISBN-13(EAN): 9781632382832 Издательство: Неизвестно Цена: 190040.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Казахстан, 010000 г. Астана, проспект Туран 43/5, НП2 (офис 2) ТОО "Логобук" Тел:+7 707 857-29-98 ,+7(7172) 65-23-70 www.logobook.kz
