Analytical Transmission Electron Microscopy, J?rgen Thomas; Thomas Gemming

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 93130.00 T
Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Автор: Ludwig Reimer; Helmut Kohl
Название: Transmission Electron Microscopy
ISBN: 144192308X ISBN-13(EAN): 9781441923080
Издательство: Springer
Рейтинг:
Цена: 139750.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.

Автор: Erni Rolf
Название: Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)
ISBN: 1783265280 ISBN-13(EAN): 9781783265282
Издательство: World Scientific Publishing
Рейтинг:
Цена: 96090.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.

Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena
Название: Advanced Transmission Electron Microscopy
ISBN: 3319151762 ISBN-13(EAN): 9783319151762
Издательство: Springer
Рейтинг:
Цена: 121890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.

Автор: Ludwig Reimer; P.W. Hawkes; C. Deininger; R.F. Ege
Название: Energy-Filtering Transmission Electron Microscopy
ISBN: 3662140551 ISBN-13(EAN): 9783662140550
Издательство: Springer
Рейтинг:
Цена: 87070.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy.

Автор: Andreas Rosenauer
Название: Transmission Electron Microscopy of Semiconductor Nanostructures
ISBN: 3662146185 ISBN-13(EAN): 9783662146187
Издательство: Springer
Рейтинг:
Цена: 87070.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.