Atomic Force Microscopy In Process Engineering, Bowen, Richard

Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola
Название: Noncontact Atomic Force Microscopy
ISBN: 3319155873 ISBN-13(EAN): 9783319155876
Издательство: Springer
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Цена: 130610.00 T
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Описание: Noncontact Atomic Force Microscopy

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
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Цена: 156720.00 T
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Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Автор: Wright Kate
Название: Scientific Researches in Atomic Force Microscopy
ISBN: 1632384094 ISBN-13(EAN): 9781632384096
Издательство: Неизвестно
Цена: 153270.00 T
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Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 0306448904 ISBN-13(EAN): 9780306448904
Издательство: Springer
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Цена: 174150.00 T
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2
ISBN: 030645596X ISBN-13(EAN): 9780306455964
Издательство: Springer
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Цена: 148010.00 T
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Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Автор: Wright Kate
Название: Atomic Force Microscopy: Biological Aspects
ISBN: 1632380595 ISBN-13(EAN): 9781632380593
Издательство: Неизвестно
Цена: 166290.00 T
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Название: Atomic force microscopy
ISBN: 149398893X ISBN-13(EAN): 9781493988938
Издательство: Springer
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Цена: 121110.00 T
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Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.

Автор: Bessie Moss, Clayton Stone
Название: Atomic Force Microscopy: Principles, Developments and Applications
ISBN: 1536134953 ISBN-13(EAN): 9781536134957
Издательство: Nova Science
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Цена: 103480.00 T
Наличие на складе: Невозможна поставка.
Описание: Atomic Force Microscopy: Principles, Developments and Applications presents Atomic Force Microscopy (AFM) as one of the most powerful tools for the analysis of morphologies because it creates three-dimensional images at the angstrom and nano scale. This technique has been exhaustively used in the analyses of the dispersion of nanometric components in nanocomposites and in polymeric blends because of the easiness of the sample preparation and lower equipment maintenance costs compared to the electron microscopy. Contributions to different application areas using the AFM are described, emphasizing the analysis of the morphology of composites/nanocomposites and polymeric blends based on elastomeric materials. Following this, the authors examine the basic concept of DEP and its integration with AFM to generate DEP, as well as review DEP-based AFM methods of imaging local electric polarizability with nanoscale spatial resolution. The direct measurement of DEP strength and polarity using a multi-pass AFM technique is described, contributing to the optimization and calibration of DEP integrated nano-devices for the effective control and manipulation of target biomolecules. The combination of in situ AFM-study of model crystals and ex situ-scanning of natural crystals makes it possible to carry out a partial reconstruction of natural crystallogenetics processes. With the use of these methods and microtomography, the authors estimate the concentration of silica in the mother solution at the time of capture of inclusions was estimated for the first time. Next, a study is presented with the goal of evaluating the morphology of surface asphalt films obtained through spin coating and characterized by AFM. The samples were pure asphalt and modified with two types of asphaltenes called continental type and archipelago type. The asphaltene fractions in the micellar system define the morphological stability of the asphalt resulting from a contribution of all the existing forces between the supramolecules of the system. The closing study presents in situ AFM investigations of crystal dissolution. The statistical data shows considerable differences in tangential dissolution rate on the two spirals consisting of nine and four screw dislocations.

Автор: Peter Eaton and Paul West.
Название: Atomic Force Microscopy
ISBN: 0198826281 ISBN-13(EAN): 9780198826286
Издательство: Oxford Academ
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Цена: 48040.00 T
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Описание: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Автор: Sanders, Wesley C. (salt Lake Community College, Ut, Usa)
Название: Atomic force microscopy
ISBN: 036721864X ISBN-13(EAN): 9780367218645
Издательство: Taylor&Francis
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Цена: 78590.00 T
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Описание: This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

Автор: Nuno C. Santos; Filomena A. Carvalho
Название: Atomic Force Microscopy
ISBN: 1493994077 ISBN-13(EAN): 9781493994076
Издательство: Springer
Рейтинг:
Цена: 158380.00 T
Наличие на складе: Поставка под заказ.
Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.

Автор: Sanders, Wesley C.
Название: Atomic Force Microscopy
ISBN: 0367371235 ISBN-13(EAN): 9780367371234
Издательство: Taylor&Francis
Рейтинг:
Цена: 158230.00 T
Наличие на складе: Невозможна поставка.
Описание: This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.