Atomic Force Microscopy, Peter Eaton and Paul West.

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
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Цена: 156720.00 T
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Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Автор: Gerd Kaupp
Название: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
ISBN: 3642066631 ISBN-13(EAN): 9783642066634
Издательство: Springer
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Цена: 174130.00 T
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Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.

Автор: Seizo Morita; Franz J. Giessibl; Roland Wiesendang
Название: Noncontact Atomic Force Microscopy
ISBN: 3642260705 ISBN-13(EAN): 9783642260704
Издательство: Springer
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Цена: 174130.00 T
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Описание: This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola
Название: Noncontact Atomic Force Microscopy
ISBN: 3319155873 ISBN-13(EAN): 9783319155876
Издательство: Springer
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Цена: 130610.00 T
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Описание: Noncontact Atomic Force Microscopy

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 0306448904 ISBN-13(EAN): 9780306448904
Издательство: Springer
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Цена: 174150.00 T
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2
ISBN: 030645596X ISBN-13(EAN): 9780306455964
Издательство: Springer
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Цена: 148010.00 T
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Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Автор: Sanders, Wesley C. (salt Lake Community College, Ut, Usa)
Название: Atomic force microscopy
ISBN: 036721864X ISBN-13(EAN): 9780367218645
Издательство: Taylor&Francis
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Цена: 78590.00 T
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Описание: This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

Автор: Wright Kate
Название: Atomic Force Microscopy: Biological Aspects
ISBN: 1632380595 ISBN-13(EAN): 9781632380593
Издательство: Неизвестно
Цена: 166290.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.

Название: Atomic force microscopy
ISBN: 149398893X ISBN-13(EAN): 9781493988938
Издательство: Springer
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Цена: 121110.00 T
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Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.

Автор: Nuno C. Santos; Filomena A. Carvalho
Название: Atomic Force Microscopy
ISBN: 1493994077 ISBN-13(EAN): 9781493994076
Издательство: Springer
Рейтинг:
Цена: 158380.00 T
Наличие на складе: Поставка под заказ.
Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.

Автор: Haugstad
Название: Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications
ISBN: 0470638826 ISBN-13(EAN): 9780470638828
Издательство: Wiley
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Цена: 139340.00 T
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Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).

Автор: Sanders, Wesley C.
Название: Atomic Force Microscopy
ISBN: 0367371235 ISBN-13(EAN): 9780367371234
Издательство: Taylor&Francis
Рейтинг:
Цена: 158230.00 T
Наличие на складе: Невозможна поставка.
Описание: This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.