Atomic Force Microscopy/Scanning Tunneling Microscopy, M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Автор: Mikio Yamashita; Hidemi Shigekawa; Ryuji Morita Название: Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy ISBN: 364205983X ISBN-13(EAN): 9783642059834 Издательство: Springer Рейтинг: Цена: 174130.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The former covers the theory of nonlinear pulse propagation beyond the slowly-varing-envelope approximation, the generation and active chirp compensation of ultrabroadband optical pulses, the amplitude and phase characterization of few- to mono-cycle pulses, and the feedback field control for the mono-cycle-like pulse generation.
This thesis focuses on the energy band engineering of graphene. It presents pioneering findings on the controlled growth of graphene and graphene-based heterostructures, as well as scanning tunneling microscopy/scanning tunneling spectroscopy (STM/STS) studies on their electronic structures. The thesis primarily investigates two classes of graphene-based systems: (i) twisted bilayer graphene, which was synthesized on Rh substrates and manifests van Hove singularities near Fermi Level, and (ii) in-plane h-BN-G heterostructures, which were controllably synthesized in an ultrahigh vacuum chamber and demonstrate intriguing electronic properties on the interface. In short, the thesis offers revealing insights into the energy band engineering of graphene-based nanomaterials, which will greatly facilitate future graphene applications.
Автор: Henning Pr?ser Название: Scanning Tunneling Spectroscopy of Magnetic Bulk Impurities ISBN: 3319063847 ISBN-13(EAN): 9783319063843 Издательство: Springer Рейтинг: Цена: 121110.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Magnetic impurities in a non-magnetic host metal have been actively explored in condensed matter physics in recent last decades. This thesis contains a comprehensive description of the STM /STS technique, sub-surface impurities, as well as single- and two-impurity Kondo physics - and as such offers a valuable introduction to newcomers to the field.
Автор: Goldstein Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 0306472929 ISBN-13(EAN): 9780306472923 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Невозможна поставка. Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
Автор: Patrick Echlin Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 0387857303 ISBN-13(EAN): 9780387857305 Издательство: Springer Рейтинг: Цена: 97820.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3 ISBN: 0306462974 ISBN-13(EAN): 9780306462979 Издательство: Springer Рейтинг: Цена: 156720.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3 ISBN: 1475781849 ISBN-13(EAN): 9781475781847 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998.
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 1475793243 ISBN-13(EAN): 9781475793246 Издательство: Springer Рейтинг: Цена: 174150.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 1475793278 ISBN-13(EAN): 9781475793277 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 030645596X ISBN-13(EAN): 9780306455964 Издательство: Springer Рейтинг: Цена: 148010.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie Название: Scanning Tunneling Microscopy I ISBN: 3540584153 ISBN-13(EAN): 9783540584155 Издательство: Springer Рейтинг: Цена: 60940.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur- rent, which flows on application of a bias voltage, to sense the atomic and elec- tronic surface structure with atomic resolution!
Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt Название: Scanning Tunneling Microscopy III ISBN: 3540608249 ISBN-13(EAN): 9783540608240 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.
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