Автор: Dai-Ming Tang Название: In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains ISBN: 3662524112 ISBN-13(EAN): 9783662524114 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.
Автор: Dai-Ming Tang Название: In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains ISBN: 3642372589 ISBN-13(EAN): 9783642372582 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.
Автор: Pratibha L. Gai Название: In-Situ Microscopy in Materials Research ISBN: 0792399897 ISBN-13(EAN): 9780792399896 Издательство: Springer Рейтинг: Цена: 204040.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1 Profile Mode 288 3. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 1 Surface Steps 295 3.
Автор: Pratibha L. Gai Название: In-Situ Microscopy in Materials Research ISBN: 1461378508 ISBN-13(EAN): 9781461378501 Издательство: Springer Рейтинг: Цена: 204040.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1 Profile Mode 288 3. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 1 Surface Steps 295 3.
Автор: Morel, Gerard , Cavalier, Annie , Williams, Lynd Название: In Situ Hybridization in Electron Microscopy ISBN: 0367455374 ISBN-13(EAN): 9780367455378 Издательство: Taylor&Francis Рейтинг: Цена: 63280.00 T Наличие на складе: Нет в наличии. Описание: In situ hybridization is a technique that allows for the visualization of specific DNA and RNA sequences in individual cells, and is an especially important method for studying nucleic acids in heterogeneous cell populations. in situ Hybridization in Electron Microscopy reviews the three main methods and describes the different stages in detail: th
Автор: Jian Min Zuo; John C.H. Spence Название: Advanced Transmission Electron Microscopy ISBN: 1493982494 ISBN-13(EAN): 9781493982493 Издательство: Springer Рейтинг: Цена: 83850.00 T Наличие на складе: Нет в наличии. Описание: As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401779880 ISBN-13(EAN): 9789401779883 Издательство: Springer Рейтинг: Цена: 69650.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Название: Scanning transmission electron microscopy ISBN: 0367197367 ISBN-13(EAN): 9780367197360 Издательство: Taylor&Francis Рейтинг: Цена: 117390.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials.
Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena Название: Advanced Transmission Electron Microscopy ISBN: 3319151762 ISBN-13(EAN): 9783319151762 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401786003 ISBN-13(EAN): 9789401786003 Издательство: Springer Рейтинг: Цена: 69870.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Автор: Brent Fultz; James Howe Название: Transmission Electron Microscopy and Diffractometry of Materials ISBN: 3642433154 ISBN-13(EAN): 9783642433153 Издательство: Springer Рейтинг: Цена: 87060.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
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