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Lifetime Reliability-aware Design of Integrated Circuits, Raji


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Цена: 79190.00T
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Автор: Raji
Название:  Lifetime Reliability-aware Design of Integrated Circuits
ISBN: 9783031153440
Издательство: Springer
Классификация:

ISBN-10: 3031153448
Обложка/Формат: Hardback
Страницы: 107
Вес: 0.36 кг.
Дата издания: 01.12.2022
Язык: English
Издание: 1st ed. 2023
Иллюстрации: 13 illustrations, color; 18 illustrations, black and white; xiii, 107 p. 31 illus., 13 illus. in color.
Размер: 242 x 166 x 14
Читательская аудитория: Professional & vocational
Основная тема: Engineering
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Дополнительное описание: 1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops.- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops.- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops.- 4 Gate Sizing-based


Fundamentals of Electromigration-Aware Integrated Circuit Design

Автор: Jens Lienig; Matthias Thiele
Название: Fundamentals of Electromigration-Aware Integrated Circuit Design
ISBN: 3030088111 ISBN-13(EAN): 9783030088118
Издательство: Springer
Рейтинг:
Цена: 74530.00 T
Наличие на складе: Нет в наличии.
Описание: The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.

Thermal-aware testing of digital vlsi circuits and systems

Автор: Chattopadhyay, Santanu (department Of Electronics And Electrical Communication Engineering, Indian Institute Of Technology Kharagpur, West Bengal, Ind
Название: Thermal-aware testing of digital vlsi circuits and systems
ISBN: 0815378823 ISBN-13(EAN): 9780815378822
Издательство: Taylor&Francis
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Цена: 63280.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

Thermal-Aware Testing of Digital VLSI Circuits and Systems

Автор: Chattopadhyay, Santanu
Название: Thermal-Aware Testing of Digital VLSI Circuits and Systems
ISBN: 0367607093 ISBN-13(EAN): 9780367607098
Издательство: Taylor&Francis
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Цена: 23470.00 T
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Variation-Aware Analog Structural Synthesis

Автор: Trent McConaghy; Pieter Palmers; Gao Peng; Michiel
Название: Variation-Aware Analog Structural Synthesis
ISBN: 9400726082 ISBN-13(EAN): 9789400726086
Издательство: Springer
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Цена: 156720.00 T
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Описание: This book describes computational intelligence-based tools for robust design of analog circuits. It starts with global variation-aware sizing and knowledge extraction and progressively extends to variation-aware topology design.

Variation-Aware Analog Structural Synthesis

Автор: Trent McConaghy; Pieter Palmers; Gao Peng; Michiel
Название: Variation-Aware Analog Structural Synthesis
ISBN: 9048129052 ISBN-13(EAN): 9789048129058
Издательство: Springer
Рейтинг:
Цена: 174150.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes computational intelligence-based tools for robust design of analog circuits. It starts with global variation-aware sizing and knowledge extraction and progressively extends to variation-aware topology design.

Power-Aware Testing and Test Strategies for Low Power Devices

Автор: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Название: Power-Aware Testing and Test Strategies for Low Power Devices
ISBN: 1441909273 ISBN-13(EAN): 9781441909275
Издательство: Springer
Рейтинг:
Цена: 148020.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions.

Power Aware Design Methodologies

Автор: Massoud Pedram; Jan M. Rabaey
Название: Power Aware Design Methodologies
ISBN: 1475785135 ISBN-13(EAN): 9781475785135
Издательство: Springer
Рейтинг:
Цена: 174150.00 T
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Описание:

Power Aware Design Methodologies is on power-awareness in design. The difference between low-power design and power-awareness in design is that whereas low-power design refers to minimizing power with or without a performance constraint, power-aware design refers to maximizing some other performance metric, subject to a power budget (even while reducing power dissipation).

Power Aware Design Methodologies was conceived as an effort to bring all aspects of power-aware design methodologies together in a single document. It covers several layers of the design hierarchy from technology, circuit logic, and architectural levels up to the system layer. It includes discussion of techniques and methodologies for improving the power efficiency of CMOS circuits (digital and analog), systems on chip, microelectronic systems, wirelessly networked systems of computational nodes and so on. In addition to providing an in-depth analysis of the sources of power dissipation in VLSI circuits and systems and the technology and design trends, this book provides a myriad of state-of-the-art approaches to power optimization and control.

The different chapters of Power Aware Design Methodologies have been written by leading researchers and experts in their respective areas. Contributions are from both academia and industry. The contributors have reported the various technologies, methodologies, and techniques in such a way that they are understandable and useful to the circuit and system designers, tool developers, and academic researchers and students.

Power Aware Design Methodologies is written for the design professional and can be used as a textbook for an advanced course on power-aware design methodologies.


Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits

Автор: Martin Wirnshofer
Название: Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits
ISBN: 9400761953 ISBN-13(EAN): 9789400761957
Издательство: Springer
Рейтинг:
Цена: 121890.00 T
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Описание: This book provides theoretical and practical background on the implementation of in-situ delay monitors. It details dynamic and adaptive voltage scaling techniques as well as the impact of variations at shrinking technology nodes.

Parasitic-Aware Optimization of CMOS RF Circuits

Автор: David J. Allstot; Jinho Park; Kiyong Choi
Название: Parasitic-Aware Optimization of CMOS RF Circuits
ISBN: 147577754X ISBN-13(EAN): 9781475777543
Издательство: Springer
Рейтинг:
Цена: 93160.00 T
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Описание: In the arena of parasitic-aware design of CMOS RF circuits, efforts are aimed at the realization of true single-chip radios with few, if any, off-chip components. The parasitic-aware RF circuit synthesis techniques described in this book effectively address critical problems in this field.

Low-Power Design and Power-Aware Verification

Автор: Progyna Khondkar
Название: Low-Power Design and Power-Aware Verification
ISBN: 3319666185 ISBN-13(EAN): 9783319666181
Издательство: Springer
Рейтинг:
Цена: 121110.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation project. This book is a first approach to establishing a comprehensive PA knowledge base.LP design, PA verification, and Unified Power Format (UPF) or IEEE-1801 power format standards are no longer special features. These technologies and methodologies are now part of industry-standard design, verification, and implementation flows (DVIF). Almost every chip design today incorporates some kind of low power technique either through power management on chip, by dividing the design into different voltage areas and controlling the voltages, through PA dynamic and PA static verification, or their combination.The entire LP design and PA verification process involves thousands of techniques, tools, and methodologies, employed from the register transfer level (RTL) of design abstraction down to the synthesis or place-and-route levels of physical design. These techniques, tools, and methodologies are evolving everyday through the progression of design-verification complexity and more intelligent ways of handling that complexity by engineers, researchers, and corporate engineering policy makers. 

Energy-Aware System Design

Автор: Chong-Min Kyung; Sungjoo Yoo
Название: Energy-Aware System Design
ISBN: 9400792581 ISBN-13(EAN): 9789400792586
Издательство: Springer
Рейтинг:
Цена: 121890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers state-of-the-art ideas for low power design methods, from circuit to architecture to software, with design case studies in three fast growing areas: solid state disks in mobile devices, biomedical electronics and wireless security systems.

Power-Aware Testing and Test Strategies for Low Power Devices

Автор: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Название: Power-Aware Testing and Test Strategies for Low Power Devices
ISBN: 1489983139 ISBN-13(EAN): 9781489983138
Издательство: Springer
Рейтинг:
Цена: 130590.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions.


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