Parasitic-Aware Optimization of CMOS RF Circuits, David J. Allstot; Jinho Park; Kiyong Choi
Автор: Ahmed Abdelgawad; Magdy Bayoumi Название: Resource-Aware Data Fusion Algorithms for Wireless Sensor Networks ISBN: 1489987061 ISBN-13(EAN): 9781489987068 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book introduces resource-aware data fusion algorithms that generate inferences by combining data from multiple sources-techniques useful in centralized and distributed systems to overcome sensor failure, technological limitations, and coverage problems.
Автор: Trent McConaghy; Pieter Palmers; Gao Peng; Michiel Название: Variation-Aware Analog Structural Synthesis ISBN: 9400726082 ISBN-13(EAN): 9789400726086 Издательство: Springer Рейтинг: Цена: 156720.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes computational intelligence-based tools for robust design of analog circuits. It starts with global variation-aware sizing and knowledge extraction and progressively extends to variation-aware topology design.
Автор: Michael Fulde Название: Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies ISBN: 9048132797 ISBN-13(EAN): 9789048132799 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book offers a technology-oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies. Coverage includes transient threshold voltage variations and integration of tunnel transistors in a multi-gage process.
Автор: Sumit Ahuja; Avinash Lakshminarayana; Sandeep Kuma Название: Low Power Design with High-Level Power Estimation and Power-Aware Synthesis ISBN: 1489987800 ISBN-13(EAN): 9781489987808 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents fresh research techniques, algorithms, methodologies and experimental results for high-level power estimation and power-aware high-level synthesis. The book will help get products to market quicker and facilitate low-power ASIC/FPGA design.
Автор: Patrick Girard; Nicola Nicolici; Xiaoqing Wen Название: Power-Aware Testing and Test Strategies for Low Power Devices ISBN: 1441909273 ISBN-13(EAN): 9781441909275 Издательство: Springer Рейтинг: Цена: 148020.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions.
Автор: Antonis Kalis; Athanasios G. Kanatas; Constantinos Название: Parasitic Antenna Arrays for Wireless MIMO Systems ISBN: 1461479983 ISBN-13(EAN): 9781461479987 Издательство: Springer Рейтинг: Цена: 148020.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides a well-rounded survey of this newly discovered wireless communication capability, from electromagnetic considerations to analogue circuits, from digital baseband control for signal generation to channel modeling and communication theory.
Автор: Martin Wirnshofer Название: Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits ISBN: 9400761953 ISBN-13(EAN): 9789400761957 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides theoretical and practical background on the implementation of in-situ delay monitors. It details dynamic and adaptive voltage scaling techniques as well as the impact of variations at shrinking technology nodes.
Автор: Patrick Girard; Nicola Nicolici; Xiaoqing Wen Название: Power-Aware Testing and Test Strategies for Low Power Devices ISBN: 1489983139 ISBN-13(EAN): 9781489983138 Издательство: Springer Рейтинг: Цена: 130590.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions.
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