Principles of Materials Characterization and Metrology, Krishnan, Kannan M.

Автор: Krishnan, Kannan M.
Название: Principles of Materials Characterization and Metrology
ISBN: 0198830254 ISBN-13(EAN): 9780198830252
Издательство: Oxford Academ
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Цена: 87650.00 T
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Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

Автор: Chander Prakash; Sunpreet Singh
Название: Characterization, Testing, Measurement, and Metrology
ISBN: 0367275155 ISBN-13(EAN): 9780367275150
Издательство: Taylor&Francis
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Цена: 188850.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Автор: Mudiwa Afolayan
Название: Metrology & Diagnostic Techniques for Nanoelectronics
ISBN: 1681177196 ISBN-13(EAN): 9781681177199
Издательство: Gazelle Book Services
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Цена: 230210.00 T
Наличие на складе: Невозможна поставка.
Описание: Metrology is the science of measurements, and nanometrology is that part of metrology that relates to measurements at the nanoscale. Many governments and regulatory bodies worldwide have existing nanotechnology policies and are taking the preliminary steps towards nanometrology strategies, for example in support of pre-normative R&D and standardisation work. The applications and economic impact of thin films for nanotechnological products are large, and extend over a wide range of industry sectors. As buried layers, thin films are core to the performance of state-of-art microelectronics and magnetic data storage devices. Metrology and Diagnostic Techniques for Nanoelectronics highlights state of art developments in devoted to advancements in all the metrological aspects related to nanoscience and nanotechnology, critical for continuing technology scaling and product innovation. It offers an inclusive overview of engineering metrology and how it relates to micro and nanotechnology research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume, written by renowned experts in the respective fields that can be used for professionals, researcher, practitioners and students. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging. The semiconductor industry faces significant challenges to continue increasing performance and functionality of information processing. New and improved metrology and characterisation is required to support these advances in density and functionality. This book brings together scientists and engineers interested in all aspects of the characterisation technology needed for nanoelectronic materials and device research, development, and manufacturing.

Автор: Mansfield
Название: Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations
ISBN: 3527340394 ISBN-13(EAN): 9783527340392
Издательство: Wiley
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Цена: 180520.00 T
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Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

Автор: S. V. Gupta
Название: Mass Metrology
ISBN: 3030124649 ISBN-13(EAN): 9783030124649
Издательство: Springer
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Цена: 121110.00 T
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Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.

Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu
Название: Information Modeling for Interoperable Dimensional Metrology
ISBN: 1447160290 ISBN-13(EAN): 9781447160298
Издательство: Springer
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Цена: 121890.00 T
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Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.

Автор: Bulska Ewa
Название: Metrology in Chemistry
ISBN: 3030075761 ISBN-13(EAN): 9783030075767
Издательство: Springer
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Цена: 79190.00 T
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Описание: In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics - such as traceability, calibration, chemical reference materials, validation and uncertainty - are covered.