Advances In Imaging And Electron Physics,151, Hawkes, Peter W.

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,131
ISBN: 0120147734 ISBN-13(EAN): 9780120147731
Издательство: Elsevier Science
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Цена: 190890.00 T
Наличие на складе: Поставка под заказ.
Описание: Covers a broad range of themes including microscopy, electromagnetic fields and image coding. This book is useful for electrical engineers, applied mathematicians and robotics experts. It places an emphasis on broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics.

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,191
ISBN: 0128022531 ISBN-13(EAN): 9780128022535
Издательство: Elsevier Science
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Цена: 190890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.

Автор: Jacobsen, Chris (argonne National Laboratory, Illinois)
Название: Advances in microscopy and microanalysis
ISBN: 1107076579 ISBN-13(EAN): 9781107076570
Издательство: Cambridge Academ
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Цена: 135170.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.

Автор: Pedrotti, Frank L. Pedrotti, Leno M. (university O
Название: Introduction to optics
ISBN: 1108428266 ISBN-13(EAN): 9781108428262
Издательство: Cambridge Academ
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Цена: 60180.00 T
Наличие на складе: Невозможна поставка.
Описание: A re-issued edition of this well-known optics textbook. Designed for intermediate and upper level undergraduates in physics and engineering, the third edition covers the traditional areas of optics whilst including modern applications.