Advances In Imaging And Electron Physics,131, Hawkes, Peter W.

Автор: Pedrotti, Frank L. Pedrotti, Leno M. (university O
Название: Introduction to optics
ISBN: 1108428266 ISBN-13(EAN): 9781108428262
Издательство: Cambridge Academ
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Цена: 60180.00 T
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Описание: A re-issued edition of this well-known optics textbook. Designed for intermediate and upper level undergraduates in physics and engineering, the third edition covers the traditional areas of optics whilst including modern applications.

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,151
ISBN: 0123742188 ISBN-13(EAN): 9780123742186
Издательство: Elsevier Science
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Цена: 190890.00 T
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Описание: Merges "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This title includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, and electromagnetic wave propagation.

Автор: Jacobsen, Chris (argonne National Laboratory, Illinois)
Название: Advances in microscopy and microanalysis
ISBN: 1107076579 ISBN-13(EAN): 9781107076570
Издательство: Cambridge Academ
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Цена: 135170.00 T
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Описание: Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.

Автор: Thomas Tschentscher, Luc Patthey
Название: Advances in X-ray Free-Electron Lasers Instrumentation IV
ISBN: 151060975X ISBN-13(EAN): 9781510609754
Издательство: Mare Nostrum (Eurospan)
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Цена: 91470.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.