Advances in Imaging and Electron Physics,191, Peter W. Hawkes
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,196 ISBN: 0128048123 ISBN-13(EAN): 9780128048122 Издательство: Elsevier Science Рейтинг: Цена: 190890.00 T Наличие на складе: Поставка под заказ. Описание: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,197 ISBN: 0128048115 ISBN-13(EAN): 9780128048115 Издательство: Elsevier Science Рейтинг: Цена: 190890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,198 ISBN: 0128048107 ISBN-13(EAN): 9780128048108 Издательство: Elsevier Science Рейтинг: Цена: 190890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronicsand Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.
Казахстан, 010000 г. Астана, проспект Туран 43/5, НП2 (офис 2) ТОО "Логобук" Тел:+7 707 857-29-98 ,+7(7172) 65-23-70 www.logobook.kz