Controlled Atmosphere Transmission Electron Microscopy: Principles and Practice, Hansen Thomas Willum, Wagner Jakob Birkedal

Автор: Dai-Ming Tang
Название: In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ISBN: 3662524112 ISBN-13(EAN): 9783662524114
Издательство: Springer
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Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.

Автор: J?rgen Thomas; Thomas Gemming
Название: Analytical Transmission Electron Microscopy
ISBN: 9401779880 ISBN-13(EAN): 9789401779883
Издательство: Springer
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Цена: 69650.00 T
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Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.

Автор: Challa S.S.R. Kumar
Название: Transmission Electron Microscopy Characterization of Nanomaterials
ISBN: 3662524627 ISBN-13(EAN): 9783662524626
Издательство: Springer
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Цена: 243800.00 T
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Описание: Covering modern applications and state-of-the-art techniques, this handbook offers a comprehensive overview on transmission electron microscopy characterization of nanomaterials. It is the third title in a 40-volume series on nanoscience and nanotechnology.

Автор: Brent Fultz; James Howe
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3642433154 ISBN-13(EAN): 9783642433153
Издательство: Springer
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Цена: 87060.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.

Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil;
Название: Sample Preparation Handbook for Transmission Electron Microscopy
ISBN: 1489998853 ISBN-13(EAN): 9781489998859
Издательство: Springer
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Цена: 121890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.

Название: Scanning transmission electron microscopy
ISBN: 0367197367 ISBN-13(EAN): 9780367197360
Издательство: Taylor&Francis
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Цена: 117390.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials.

Автор: Jian Min Zuo; John C.H. Spence
Название: Advanced Transmission Electron Microscopy
ISBN: 1493982494 ISBN-13(EAN): 9781493982493
Издательство: Springer
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Цена: 83850.00 T
Наличие на складе: Поставка под заказ.
Описание: As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.