Transmission Electron Microscopy Characterization of Nanomaterials, Challa S.S.R. Kumar

Автор: Dai-Ming Tang
Название: In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ISBN: 3662524112 ISBN-13(EAN): 9783662524114
Издательство: Springer
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Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.

Автор: Thomas, Sabu
Название: Microscopy Methods in Nanomaterials Characterization
ISBN: 0323461417 ISBN-13(EAN): 9780323461412
Издательство: Elsevier Science
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Цена: 179660.00 T
Наличие на складе: Поставка под заказ.
Описание:

Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials.

Автор: H.H. Kausch, H.G. Zachmann, G. Bodor, G. Elsner, J
Название: Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy (Advances in Polymer Science) (Volume 67)
ISBN: 366215966X ISBN-13(EAN): 9783662159668
Издательство: Springer
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Цена: 81050.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 93130.00 T
Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Автор: Andreas Rosenauer
Название: Transmission Electron Microscopy of Semiconductor Nanostructures
ISBN: 3662146185 ISBN-13(EAN): 9783662146187
Издательство: Springer
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Цена: 87070.00 T
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Описание: This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.

Автор: Brent Fultz; James Howe
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3642433154 ISBN-13(EAN): 9783642433153
Издательство: Springer
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Цена: 87060.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.

Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil;
Название: Sample Preparation Handbook for Transmission Electron Microscopy
ISBN: 1489998853 ISBN-13(EAN): 9781489998859
Издательство: Springer
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Цена: 121890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.

Автор: J?rgen Thomas; Thomas Gemming
Название: Analytical Transmission Electron Microscopy
ISBN: 9401779880 ISBN-13(EAN): 9789401779883
Издательство: Springer
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Цена: 69650.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.

Автор: Dai-Ming Tang
Название: In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ISBN: 3642372589 ISBN-13(EAN): 9783642372582
Издательство: Springer
Рейтинг:
Цена: 102480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.