Optical Metrology for Precision Engineering, Wei Gao, Yuki Shimizu

Автор: Wei Gao, Yuki Shimizu
Название: Optical Metrology for Precision Engineering
ISBN: 3110541270 ISBN-13(EAN): 9783110541274
Издательство: Walter de Gruyter
Рейтинг:
Цена: 153660.00 T
Наличие на складе: Нет в наличии.
Описание:

This book provides readers the fundamentals of optical metrology for precision engineering. The next-generation measurement technologies based on ultrashort pulse laser and optical frequency comb are also presented, making it an essential reference book for various engineering fields.
• Introduces fundamental theories and techniques
• Combines theories with practical applications
• Presents technologies in an easy-to-understand way

Автор: Raghavendra, N V; Krishnamurthy, L
Название: Engineering Metrology and Measurements
ISBN: 0198085494 ISBN-13(EAN): 9780198085492
Издательство: Oxford Academ
Цена: 31670.00 T
Наличие на складе: Поставка под заказ.
Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

Автор: Santoyo
Название: Handbook Optical Metrology
ISBN: 1420007920 ISBN-13(EAN): 9781420007923
Издательство: Taylor&Francis
Цена: 75530.00 T
Наличие на складе: Нет в наличии.

Автор: Tom Proulx
Название: Optical Measurements, Modeling, and Metrology, Volume 5
ISBN: 1461429056 ISBN-13(EAN): 9781461429050
Издательство: Springer
Рейтинг:
Цена: 243800.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.

Автор: Kevin G. Harding
Название: Practical Optical Dimensional Metrology
ISBN: 1510622934 ISBN-13(EAN): 9781510622937
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 56850.00 T
Наличие на складе: Невозможна поставка.
Описание: Practical Optical Dimensional Metrology provides basic explanations of the operation and application of the most common methods in the field and in commercial use. The first half of the book presents a working knowledge of the mechanism and limitations of optical dimensional measurement methods that use: light level changes, two-dimensional imaging, triangulation, structured-light patterns, interference patterns, optical focus, light characteristics such as polarization, and hybrid methods with mechanical or other measurement tools. The book concludes with a series of manufacturing application examples that look at measurements from the centimeter range down to the nanometer range.

Автор: French College
Название: Metrology in Industry: The Key for Quality
ISBN: 1905209517 ISBN-13(EAN): 9781905209514
Издательство: Wiley
Рейтинг:
Цена: 146730.00 T
Наличие на складе: Поставка под заказ.
Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.

Автор: Richard Leach
Название: Advances in Optical Form and Coordinate Metrology
ISBN: 0750325224 ISBN-13(EAN): 9780750325226
Издательство: INGRAM PUBLISHER SERVICES UK
Рейтинг:
Цена: 168960.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.

Автор: Chander Prakash; Sunpreet Singh
Название: Characterization, Testing, Measurement, and Metrology
ISBN: 0367275155 ISBN-13(EAN): 9780367275150
Издательство: Taylor&Francis
Рейтинг:
Цена: 188850.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Автор: Krishnan, Kannan M.
Название: Principles of Materials Characterization and Metrology
ISBN: 0198830262 ISBN-13(EAN): 9780198830269
Издательство: Oxford Academ
Рейтинг:
Цена: 41170.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

Автор: Selim M. Shahriar
Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
ISBN: 1628419989 ISBN-13(EAN): 9781628419986
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 107190.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
ISBN: 1510606793 ISBN-13(EAN): 9781510606791
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 121970.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 132130.00 T
Наличие на складе: Нет в наличии.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.