Metrology of Automated Tests: Static and Dynamic Characteristics, Viacheslav Karmalita
Автор: Raghavendra, N V; Krishnamurthy, L Название: Engineering Metrology and Measurements ISBN: 0198085494 ISBN-13(EAN): 9780198085492 Издательство: Oxford Academ Цена: 31670.00 T Наличие на складе: Поставка под заказ. Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Автор: Viacheslav Karmalita Название: Metrology of Automated Tests: Static and Dynamic Characteristics ISBN: 3110666642 ISBN-13(EAN): 9783110666649 Издательство: Walter de Gruyter Цена: 86720.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
This book offers an in-depth discussion related to metrological aspects of automated tests. The accuracy of experimental estimates of test object performance is examined from the standpoint of their statistical variance and systematic biases.
The proposed metrological model of automated tests allows to determine the metrological characteristics of measurement means using data from their static and dynamic calibrations. Knowledge of these characteristics provides an ability to examine their impact on the accuracy of test results for the purposes of estimating statistical uncertainties caused by instrumentation errors and eliminating biases that occur as a consequence of inertial properties of measurement means.
Optimization of requirements for measurement errors to ensure a given accuracy of test results is discussed as well.
Proposed approaches and described methods are illustrated by test examples of turbomachinery products.
Автор: Chander Prakash; Sunpreet Singh Название: Characterization, Testing, Measurement, and Metrology ISBN: 0367275155 ISBN-13(EAN): 9780367275150 Издательство: Taylor&Francis Рейтинг: Цена: 188850.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.
Автор: Richard Leach Название: Advances in Optical Form and Coordinate Metrology ISBN: 0750325224 ISBN-13(EAN): 9780750325226 Издательство: INGRAM PUBLISHER SERVICES UK Рейтинг: Цена: 168960.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.
Автор: Erik Novak, James Trolinger Название: Applied Optical Metrology II ISBN: 1510612033 ISBN-13(EAN): 9781510612037 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 81310.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Annette T. Torres, Fernando Mendoza Santoyo, Eugenio R. Mendez Название: SPECKLE 2015: VI International Conference on Speckle Metrology ISBN: 1628418788 ISBN-13(EAN): 9781628418781 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 91470.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Balasubramanian Muralikrishnan; Jayaraman Raja Название: Computational Surface and Roundness Metrology ISBN: 1849967733 ISBN-13(EAN): 9781849967730 Издательство: Springer Рейтинг: Цена: 113180.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.
Автор: Selim Shahriar, Jacob Scheuer Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X ISBN: 1510606793 ISBN-13(EAN): 9781510606791 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 121970.00 T Наличие на складе: Нет в наличии. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Balasubramanian Muralikrishnan; Jayaraman Raja Название: Computational Surface and Roundness Metrology ISBN: 1848002963 ISBN-13(EAN): 9781848002968 Издательство: Springer Рейтинг: Цена: 139310.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Presents a practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. This book provides a tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology.
Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu Название: Information Modeling for Interoperable Dimensional Metrology ISBN: 1447160290 ISBN-13(EAN): 9781447160298 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.
Автор: Bulska Ewa Название: Metrology in Chemistry ISBN: 3030075761 ISBN-13(EAN): 9783030075767 Издательство: Springer Рейтинг: Цена: 79190.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics - such as traceability, calibration, chemical reference materials, validation and uncertainty - are covered.
Автор: Andrea De Marchi Название: Frequency Standards and Metrology ISBN: 3642745032 ISBN-13(EAN): 9783642745034 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
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