Computational Surface and Roundness Metrology, Balasubramanian Muralikrishnan; Jayaraman Raja
Автор: Santoyo Название: Handbook Optical Metrology ISBN: 1420007920 ISBN-13(EAN): 9781420007923 Издательство: Taylor&Francis Цена: 75530.00 T Наличие на складе: Нет в наличии.
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Автор: Pavese Franco Et Al Название: Advanced Mathematical And Computational Tools In Metrology And Testing X ISBN: 9814678619 ISBN-13(EAN): 9789814678612 Издательство: World Scientific Publishing Цена: 147840.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing.
Автор: Pavese Franco Et Al Название: Advanced Mathematical And Computational Tools In Metrology And Testing Ix ISBN: 9814397946 ISBN-13(EAN): 9789814397940 Издательство: World Scientific Publishing Рейтинг: Цена: 157350.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Автор: Servin Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications ISBN: 3527411526 ISBN-13(EAN): 9783527411528 Издательство: Wiley Рейтинг: Цена: 125610.00 T Наличие на складе: Поставка под заказ. Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
Автор: Petrie Название: Inductive Metrology ISBN: 1108065767 ISBN-13(EAN): 9781108065764 Издательство: Cambridge Academ Рейтинг: Цена: 23230.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: As a young man, Sir William Matthew Flinders Petrie (1853-1942) published in 1877 this innovative approach to metrology, based on his early surveying experiences. It analyses monuments from a range of civilisations to determine their methods of linear measurement. Notably, Petrie establishes that societies without writing systems could also make accurate measurements.
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