Many books and reviews about scanning probe microscopies (SPM) cover the basics of their performance, novel developments, and state-of-the-art applications. Taking a different approach, Hybridizing Surface Probe Microscopies: Towards a Full Description of the Meso- and Nanoworlds encompasses the technical efforts in combining SPM with spectroscopic and optical complementary techniques that, altogether, provide a complete description of nanoscale and mesoscale systems and processes from corrosion to enzymatic reactions.
The book is organized into eight chapters, following a general scheme that revolves around the two main capabilities of SPM: imaging and measuring interactions. Each chapter introduces key theoretical concepts and basic equations of the particular stand-alone technique with which the scanning probe microscopies are combined. Chapters end with the SPM-technique combination and some real-world examples in which the combination has been devised or used. Most chapters include a historical review of the techniques and numerous illustrations to support key ideas and provide the reader with intuitive understanding.
To understand the limitations of any technique also means to understand how this technique works. This book has devoted a considerable amount of space in explaining the basics of each technique as they are being introduced. At the same time, it avoids explaining the particularities of each SPM-based technique and opts for a rather generalized approach. In short, the book's focus is not on what SPM can do, but rather on what SPM cannot do and, most specifically, on presenting the experimental approaches that circumvent these limitations.
Автор: Chiu W. Название: Single Atom Imaging in High Resolution Electron Microscopy ISBN: 1288823436 ISBN-13(EAN): 9781288823437 Издательство: Неизвестно Рейтинг: Цена: 71050.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Bella B. Smoliar; Victor A. Drits Название: Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures ISBN: 3642717314 ISBN-13(EAN): 9783642717314 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book.
Автор: Daisuke Shindo; Hiraga Kenji Название: High-Resolution Electron Microscopy for Materials Science ISBN: 4431702342 ISBN-13(EAN): 9784431702344 Издательство: Springer Рейтинг: Цена: 87070.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials.
Автор: Tanaka Nobuo Название: Scanning Transmission Electron Microscopy of Nanomaterials ISBN: 184816789X ISBN-13(EAN): 9781848167896 Издательство: World Scientific Publishing Рейтинг: Цена: 205920.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.
Автор: Challa S.S.R. Kumar Название: Transmission Electron Microscopy Characterization of Nanomaterials ISBN: 3662524627 ISBN-13(EAN): 9783662524626 Издательство: Springer Рейтинг: Цена: 243800.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Covering modern applications and state-of-the-art techniques, this handbook offers a comprehensive overview on transmission electron microscopy characterization of nanomaterials. It is the third title in a 40-volume series on nanoscience and nanotechnology.
Автор: Barabash Rozaliya, Ice Gene Название: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects ISBN: 1908979623 ISBN-13(EAN): 9781908979629 Издательство: World Scientific Publishing Рейтинг: Цена: 158400.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
