Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, Stephen L. O`Deill, Giovanni Pareschi

Автор: Oswald H. Siegmund
Название: UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XX
ISBN: 1510612513 ISBN-13(EAN): 9781510612518
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Arnold Burger, Ralph James, Michael Fiederle, Larry Franks
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
ISBN: 1510612416 ISBN-13(EAN): 9781510612419
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Ralph B. James, Michael Fiederle, Arnold Burger, Larry Franks
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII
ISBN: 1510603271 ISBN-13(EAN): 9781510603271
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Автор: Jan-Willem den Herder, Kazuhiro Nakazawa
Название: Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
ISBN: 1510619518 ISBN-13(EAN): 9781510619517
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Stephen Payne, Ralph James, Arnold Burger, Michael Fiederle
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX
ISBN: 1510620958 ISBN-13(EAN): 9781510620957
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Rene Hudec, Ladislav Pina
Название: EUV and X-ray Optics: Synergy between Laboratory and Space V
ISBN: 1510609717 ISBN-13(EAN): 9781510609716
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Christian Morawe, Ali Khounsary, Shunji Goto
Название: Advances in X-Ray/EUV Optics and Components XII
ISBN: 1510612297 ISBN-13(EAN): 9781510612297
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Shunji Goto, Christian Morawe, Ali Khounsary
Название: Advances in X-Ray/EUV Optics and Components XIII
ISBN: 1510620915 ISBN-13(EAN): 9781510620919
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VII
ISBN: 1510612270 ISBN-13(EAN): 9781510612273
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Ali M. Khounsary, Shunji Goto, Christian Morawe
Название: Advances in X-Ray/EUV Optics and Components XI
ISBN: 1510603174 ISBN-13(EAN): 9781510603172
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VI
ISBN: 1510603158 ISBN-13(EAN): 9781510603158
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Libor Juha, Sasa Bajt, Regina Soufli
Название: Damage to VUV, EUV, and X-ray Optics VI
ISBN: 1510609733 ISBN-13(EAN): 9781510609730
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.