Testing and Diagnosis of VLSI and ULSI, F. Lombardi; M.G. Sami

Автор: Yosi Shacham-Diamand; Tetsuya Osaka; Madhav Datta;
Название: Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
ISBN: 1461497442 ISBN-13(EAN): 9781461497448
Издательство: Springer
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Цена: 213360.00 T
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Описание: Electromechanical processes for Ultra-large-Scale Integration technology for Integrated Circuits applications is a new frontier in electrochemistry and science. This book details copper based interconnect technology for ULSI technology to ICs application.

Автор: Angela Krstic; Kwang-Ting (Tim) Cheng
Название: Delay Fault Testing for VLSI Circuits
ISBN: 1461375614 ISBN-13(EAN): 9781461375616
Издательство: Springer
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Цена: 130610.00 T
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Описание: In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Автор: Michael Nicolaidis; Yervant Zorian; Dhiraj Pradhan
Название: On-Line Testing for VLSI
ISBN: 1441950338 ISBN-13(EAN): 9781441950338
Издательство: Springer
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Цена: 113180.00 T
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Описание: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing.

Автор: Ravi K. Gulati; Charles F. Hawkins
Название: IDDQ Testing of VLSI Circuits
ISBN: 1461363772 ISBN-13(EAN): 9781461363774
Издательство: Springer
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Цена: 93160.00 T
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Описание: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 174130.00 T
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Benoit Nadeau-Dostie
Название: Design for AT-Speed Test, Diagnosis and Measurement
ISBN: 1475782918 ISBN-13(EAN): 9781475782912
Издательство: Springer
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Цена: 139750.00 T
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Описание: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

Автор: William R. Simpson; John W. Sheppard
Название: System Test and Diagnosis
ISBN: 146136163X ISBN-13(EAN): 9781461361633
Издательство: Springer
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Цена: 139750.00 T
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Описание: System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail.

Автор: Fabrizio Caccavale; Luigi Villani
Название: Fault Diagnosis and Fault Tolerance for Mechatronic Systems: Recent Advances
ISBN: 3642079121 ISBN-13(EAN): 9783642079122
Издательство: Springer
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Цена: 130590.00 T
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Описание: This book will play a central role in ensuring safe and reliable behaviour of intelligent and autonomous systems. It collects some of the most recent results in fault diagnosis and fault tolerant systems, with particular emphasis on mechatronic systems.

Автор: Wolfgang Borutzky
Название: Bond Graph Model-based Fault Diagnosis of Hybrid Systems
ISBN: 3319352261 ISBN-13(EAN): 9783319352268
Издательство: Springer
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Цена: 104480.00 T
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Описание: This book presents bond graph model-based fault detection with a focus on hybrid system models. The book addresses model design, simulation, control and model-based fault diagnosis of multidisciplinary engineering systems. The text beings with a brief survey of the state-of-the-art, then focuses on hybrid systems.

Автор: Steven X. Ding
Название: Model-Based Fault Diagnosis Techniques
ISBN: 1447161114 ISBN-13(EAN): 9781447161110
Издательство: Springer
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Цена: 156720.00 T
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Описание: This book gives readers a framework of model-based FDI techniques, helping them to become familiar with the basic ideas and schemes in a systematic way. Examples and benchmarks provide a means of practising the ideas and judging the methods described.

Автор: Mohamed Belhaq
Название: Structural Nonlinear Dynamics and Diagnosis
ISBN: 3319198505 ISBN-13(EAN): 9783319198507
Издательство: Springer
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Цена: 243800.00 T
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Описание: Recent Advances of Structural Life Assessment and Related Problems.- Electromagnetic Impact Vibration Energy Harvesters.- Numerical and Experimental Assessment of the Modal Curvature Method for Damage Detection in Plate Structures.- Proposal of a Nonlinear Piezoelectric Coupling Term to Energy Harvesting Interactions.- Effect of Reinforced Concrete Deterioration and Damage on the Seismic Performance of Structures.- Recurrence and Joint Recurrence Analysis of Multiple Attractors Energy Harvesting System.- Quasiperiodic Galloping of a Wind-Excited Tower under External Forcing and Parametric Damping.- On Optimal Control of a Nonlinear Robotic Mechanism Using the Saturation Phenomenon.- Quasi-Coordinates Based Dynamics Control Design for Constrained Systems.- Quasi-Periodically Actuated Capacitive Micro electromechanical systems.

Автор: Wolfgang Borutzky
Название: Bond Graphs for Modelling, Control and Fault Diagnosis of Engineering Systems
ISBN: 3319474332 ISBN-13(EAN): 9783319474335
Издательство: Springer
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Цена: 186330.00 T
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Описание: This compilation of contributions from experts across the world addresses readers in academia and industry who are concerned with control system design. It covers theoretical topics, applications in various areas as well as software for bond graph modelling.