IUTAM Symposium on Diffraction and Scattering in Fluid Mechanics and Elasticity, I. David Abrahams; Paul A Martin; Michael J. Simon
Автор: I. David Abrahams; Paul A Martin; Michael J. Simon Название: IUTAM Symposium on Diffraction and Scattering in Fluid Mechanics and Elasticity ISBN: 1402005903 ISBN-13(EAN): 9781402005909 Издательство: Springer Рейтинг: Цена: 204040.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Summarises the developments in diffraction theory as reported at the IUTAM Symposium on Diffraction and Scattering in Fluid Mechanics and Elasticity held in Manchester, England, in July 2000. The topics covered include surface water waves and other geophysical waves, diffraction and propagation of acoustic waves, and more.
Автор: Hayes Michael, Saccomandi Giuseppe Название: Topics in Finite Elasticity ISBN: 3211833366 ISBN-13(EAN): 9783211833360 Издательство: Springer Рейтинг: Цена: 113190.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Elements of the Theory of Finite Strain (Ph. Boulanger, M. Hayes); Seven Lectures on Finite Elasticity (M. F. Beatty); Universal Solutions and Relations in Finite Elasticity (G. Saccomandi); Finite-Amplitude Waves in Mooney-Rivlin and Hadamard Materials (Ph. Boulanger, M. Hayes); Elements of Elastic Stability Theory (R. J. Knops); Story of f: the Driving Force on a Phase Boundary (R. Abeyaratne)
Автор: Timoshenko Название: Theory of Elasticity ISBN: 0070858055 ISBN-13(EAN): 9780070858053 Издательство: McGraw-Hill Рейтинг: Цена: 52610.00 T Наличие на складе: Поставка под заказ. Описание: Presents a collection of real-world stories that inspire readers to take action in their own lives to make a difference in their organisations and communities. This book provides advice on a range of topics - from working with city hall to embracing diversity, capitalising on adversity and expressing gratitude.
Автор: M.T. Hutchings; Aaron D. Krawitz Название: Measurement of Residual and Applied Stress Using Neutron Diffraction ISBN: 9401052425 ISBN-13(EAN): 9789401052429 Издательство: Springer Рейтинг: Цена: 81050.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991
Автор: Donald E. Carlson; R.T. Shield Название: Proceedings of the IUTAM Symposium on Finite Elasticity ISBN: 9400975406 ISBN-13(EAN): 9789400975408 Издательство: Springer Рейтинг: Цена: 81050.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the IUTAM Symposium, Lehigh University, Bethlehem, PA, USA, August 10-15, 1980
Автор: C. Suryanarayana; M. Grant Norton Название: X-Ray Diffraction ISBN: 1489901507 ISBN-13(EAN): 9781489901507 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a hands on approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Автор: Reuben Rudman Название: Low-Temperature X-Ray Diffraction ISBN: 1461587735 ISBN-13(EAN): 9781461587736 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.
Автор: Shih-Lin In-Hang Название: Multiple Diffraction of X-Rays in Crystals ISBN: 3642821685 ISBN-13(EAN): 9783642821684 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg`s law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction.
Автор: Vasili M. Babic; Edward F. Kuester; Vladimir S. Bu Название: Short-Wavelength Diffraction Theory ISBN: 3642834612 ISBN-13(EAN): 9783642834615 Издательство: Springer Рейтинг: Цена: 65290.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In the study of short-wave diffraction problems, asymptotic methods - the ray method, the parabolic equation method, and its further development as the "etalon" (model) problem method - play an important role.
Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda Название: X-Ray Diffraction Crystallography ISBN: 3642442552 ISBN-13(EAN): 9783642442551 Издательство: Springer Рейтинг: Цена: 113180.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
Автор: Max Gulde Название: Development of an Ultrafast Low-Energy Electron Diffraction Setup ISBN: 3319386964 ISBN-13(EAN): 9783319386966 Издательство: Springer Рейтинг: Цена: 87060.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents an Ultrafast Low-Energy Electron Diffraction (ULEED) system that reveals ultrafast structural changes on the atomic scale. This new experimental approach permits time-resolved structural investigations of systems that were previously partially or totally inaccessible, including surfaces, interfaces and atomically thin films.
Автор: Eric J. Mittemeijer; Paolo Scardi Название: Diffraction Analysis of the Microstructure of Materials ISBN: 3642073522 ISBN-13(EAN): 9783642073526 Издательство: Springer Рейтинг: Цена: 217670.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.
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