IUTAM Symposium on Diffraction and Scattering in Fluid Mechanics and Elasticity, I. David Abrahams; Paul A Martin; Michael J. Simon
Автор: M.T. Hutchings; Aaron D. Krawitz Название: Measurement of Residual and Applied Stress Using Neutron Diffraction ISBN: 9401052425 ISBN-13(EAN): 9789401052429 Издательство: Springer Рейтинг: Цена: 81050.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991
Автор: Danilo Capecchi; Giuseppe Ruta Название: Strength of Materials and Theory of Elasticity in 19th Century Italy ISBN: 3319382721 ISBN-13(EAN): 9783319382722 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book examines the theoretical foundations underpinning the field of strength of materials/theory of elasticity, beginning from the origins of the modern theory of elasticity.
Автор: Hayes Michael, Saccomandi Giuseppe Название: Topics in Finite Elasticity ISBN: 3211833366 ISBN-13(EAN): 9783211833360 Издательство: Springer Рейтинг: Цена: 113190.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Elements of the Theory of Finite Strain (Ph. Boulanger, M. Hayes); Seven Lectures on Finite Elasticity (M. F. Beatty); Universal Solutions and Relations in Finite Elasticity (G. Saccomandi); Finite-Amplitude Waves in Mooney-Rivlin and Hadamard Materials (Ph. Boulanger, M. Hayes); Elements of Elastic Stability Theory (R. J. Knops); Story of f: the Driving Force on a Phase Boundary (R. Abeyaratne)
Автор: Paolo Podio-Guidugli; Antonino Favata Название: Elasticity for Geotechnicians ISBN: 3319345303 ISBN-13(EAN): 9783319345307 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This self-contained book presents problems in classical elasticity, tailored for the geotechnician. Each begins with an examination of prevailing symmetries, and moves from a search for balanced stress fields to the associated strain and displacement fields.
Автор: I. David Abrahams; Paul A Martin; Michael J. Simon Название: IUTAM Symposium on Diffraction and Scattering in Fluid Mechanics and Elasticity ISBN: 9048160103 ISBN-13(EAN): 9789048160105 Издательство: Springer Рейтинг: Цена: 204040.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the IUTAM Symposium held in Manchester, United Kingdom, 16-20 July 2000
Автор: Vasili M. Babic; Edward F. Kuester; Vladimir S. Bu Название: Short-Wavelength Diffraction Theory ISBN: 3642834612 ISBN-13(EAN): 9783642834615 Издательство: Springer Рейтинг: Цена: 65290.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In the study of short-wave diffraction problems, asymptotic methods - the ray method, the parabolic equation method, and its further development as the "etalon" (model) problem method - play an important role.
Автор: Barabash Rozaliya, Ice Gene Название: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects ISBN: 1908979623 ISBN-13(EAN): 9781908979629 Издательство: World Scientific Publishing Рейтинг: Цена: 158400.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Автор: V. M. Babic; E. F. Kuester; N. Y. Kirpicnikova Название: The Boundary-Layer Method in Diffraction Problems ISBN: 3642883931 ISBN-13(EAN): 9783642883934 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: It has become almost a cliche to preface one`s remarks about asymptotic tech- niques with the statement that only a very few special problems in diffrac- tion theory (be it electromagnetic, acoustic, elastic or other phenomena) are possessed of closed form solutions, but as with many cliches, this is because it is true.
Автор: P. Podio-Guidugli Название: A Primer in Elasticity ISBN: 0792366425 ISBN-13(EAN): 9780792366423 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Presents the foundational issues of linear elasticity. This book illustrates the concepts of deformation and strain and of force and stress. It studies constitutive relations, and discusses the posing of equilibrium problems.
Автор: Danilo Capecchi; Giuseppe Ruta Название: Strength of Materials and Theory of Elasticity in 19th Century Italy ISBN: 3319055232 ISBN-13(EAN): 9783319055237 Издательство: Springer Рейтинг: Цена: 148020.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book examines the theoretical foundations underpinning the field of strength of materials/theory of elasticity, beginning from the origins of the modern theory of elasticity.
Автор: Guy Chavent; Pierre C. Sabatier Название: Inverse Problems of Wave Propagation and Diffraction ISBN: 366214154X ISBN-13(EAN): 9783662141540 Издательство: Springer Рейтинг: Цена: 74530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes the state of the art in the field of modeling and solving numerically inverse problems of wave propagation and diffraction. Topics treated are the obstacle problem, scattering by classical media, and scattering by distributed media.
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